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Herbert Zirath
Articles in Scholarly Journals [Incomplete List]
DC and microwave performance of AlGaN/GaN HEMTs passivated with sputtered SiNx
Semiconductor Science and Technology, vol. 22, no. 7, pp. 717–721, 2007
60 GHz Single-Chip Front-End MMICs and Systems for Multi-Gb/s Wireless Communication
IEEE Journal of Solid-State Circuits, vol. 42, no. 5, pp. 1143–1157, 2007
Oxygen Ion Implantation Isolation Planar Process for AlGaN/GaN HEMTs
IEEE Electron Device Letters, vol. 28, no. 6, pp. 476–478, 2007
High-Power-Density 4H-SiC RF MOSFETs
IEEE Electron Device Letters, vol. 27, no. 6, pp. 469–471, 2006
Fabrication and Characterization of Field-Plated Buried-Gate SiC MESFETs
IEEE Electron Device Letters, vol. 27, no. 7, pp. 573–575, 2006
Fully Integrated 60-GHz Single-Ended Resistive Mixer in 90-nm CMOS Technology
IEEE Microwave and Wireless Components Letters, vol. 16, no. 1, pp. 25–27, 2006
Comparison of the DC and Microwave Performance of AlGaN/GaN HEMTs Grown on SiC by MOCVD With Fe-Doped or Unintentionally Doped GaN Buffer Layers
IEEE Transactions on Electron Devices, vol. 53, no. 9, pp. 2413–2417, 2006
High Gain Active Microstrip Antenna for 60-GHz WLAN/WPAN Applications
IEEE Transactions on Microwave Theory and Techniques, vol. 54, no. 6, pp. 2593–2603, 2006
A 45-dB Variable-Gain Low-Noise MMIC Amplifier
IEEE Transactions on Microwave Theory and Techniques, vol. 54, no. 6, pp. 2848–2855, 2006
High-Purity 60-GHz-Band Single-Chip
$times$
8 Multipliers in pHEMT and mHEMT Technology
IEEE Transactions on Microwave Theory and Techniques, vol. 54, no. 6, pp. 2887–2898, 2006
An SiC MESFET-Based MMIC Process
IEEE Transactions on Microwave Theory and Techniques, vol. 54, no. 12, pp. 4072–4078, 2006
60 GHz MMIC double balanced Gilbert mixer in mHEMT technology with integrated RF, LO and IF baluns
Electronics Letters, vol. 42, no. 24, p. 1402, 2006
Transmission electron microscopy assessment of the Si enhancement of Ti∕Al∕Ni∕Au Ohmic contacts to undoped AlGaN∕GaN heterostructures
Journal of Applied Physics, vol. 100, no. 3, p. 034904, 2006
Growth of Fe doped semi-insulating GaN on sapphire and 4H-SiC by MOCVD
physica status solidi (c), vol. 3, no. 6, pp. 2231–2236, 2006
Integration of components in a 50-nm pseudomorphic In0.65Ga0.35As–In0.40Al0.60As–InP HEMT MMIC technology
Solid-State Electronics, vol. 50, no. 5, pp. 858–864, 2006
Effect of AlN nucleation layer on the structural properties of bulk GaN grown on sapphire by molecular-beam epitaxy
Journal of Applied Physics, vol. 98, no. 1, p. 016109, 2005
Balanced Colpitt Oscillator MMICs Designed for Ultra-Low Phase Noise
IEEE Journal of Solid-State Circuits, vol. 40, no. 10, pp. 2077–2086, 2005
Highly Integrated 60 GHz Transmitter and Receiver MMICs in a GaAs pHEMT Technology
IEEE Journal of Solid-State Circuits, vol. 40, no. 11, pp. 2174–2186, 2005
<tex>$L$</tex>-Band LDMOS Power Amplifiers Based on an Inverse Class-F Architecture
IEEE Transactions on Microwave Theory and Techniques, vol. 53, no. 6, pp. 2007–2012, 2005
Lumped-Element Quadrature Power Splitters Using Mixed Right/Left-Handed Transmission Lines
IEEE Transactions on Microwave Theory and Techniques, vol. 53, no. 8, pp. 2616–2621, 2005
High Field-Effect Mobility in n-Channel Si Face 4H-SiC MOSFETs With Gate Oxide Grown on Aluminum Ion-Implanted Material
IEEE Electron Device Letters, vol. 26, no. 2, pp. 96–98, 2005
Low-Resistance Si/Ti/Al/Ni/Au Multilayer Ohmic Contact to Undoped AlGaN/GaN Heterostructures
Electrochemical and Solid-State Letters, vol. 7, no. 4, p. G72, 2004
Fabrication and Characterization of Reactively Sputtered TaN Thin-Film Resistors for Millimeter Wave Applications
Electrochemical and Solid-State Letters, vol. 7, no. 11, p. G261, 2004
A Comprehensive Analysis of IMD Behavior in RF CMOS Power Amplifiers
IEEE Journal of Solid-State Circuits, vol. 39, no. 1, pp. 24–34, 2004
Development of 60-GHz Front-End Circuits for a High-Data-Rate Communication System
IEEE Journal of Solid-State Circuits, vol. 39, no. 10, pp. 1640–1649, 2004
High field effect mobility in Si face 4H-SiC MOSFET transistors
Electronics Letters, vol. 40, no. 8, p. 508, 2004
4H-silicon carbide schottky barrier diodes for microwave applications
IEEE Transactions on Microwave Theory and Techniques, vol. 51, no. 3, pp. 796–804, 2003
Cryogenic wide-band ultra-low-noise if amplifiers operating at ultra-low DC power
IEEE Transactions on Microwave Theory and Techniques, vol. 51, no. 6, pp. 1705–1711, 2003
90-nm CMOS for microwave power applications
IEEE Microwave and Wireless Components Letters, vol. 13, no. 12, pp. 523–525, 2003
On the performance of low-noise low-DC-power-consumption cryogenic amplifiers
IEEE Transactions on Microwave Theory and Techniques, vol. 50, no. 6, pp. 1480–1486, 2002
Prediction of IMD in LDMOS transistor amplifiers using a new large-signal model
IEEE Transactions on Microwave Theory and Techniques, vol. 50, no. 12, pp. 2834–2842, 2002
Influence of the calibration kit on the estimation of parasitic effects in HEMT devices at microwave frequencies
IEEE Transactions on Instrumentation and Measurement, vol. 51, no. 4, pp. 650–655, 2002
A balanced FET FMCW radar transceiver with improved AM noise performance
IEEE Transactions on Microwave Theory and Techniques, vol. 50, no. 4, pp. 1224–1227, 2002
1 W/mm RF power density at 3.2 GHz for a dual-layer RESURF LDMOS transistor
IEEE Electron Device Letters, vol. 23, no. 4, pp. 206–208, 2002
Resistive SiC-MESFET mixer
IEEE Microwave and Wireless Components Letters, vol. 12, no. 4, pp. 119–121, 2002
Initial growth of GaN on a-Al[sub 2]O[sub 3](0001) by molecular beam epitaxy
Applied Physics Letters, vol. 81, no. 4, p. 664, 2002
Room-temperature and 50 GHz operation of a functional nanomaterial
Applied Physics Letters, vol. 79, no. 9, p. 1357, 2001
Design and characterisation of singly balanced silicon carbide Schottky diode high-level mixer
Electronics Letters, vol. 37, no. 1, p. 54, 2001
Microwave silicon carbide Schottky diodes
Electronics Letters, vol. 37, no. 4, p. 250, 2001
Analog MMICs for millimeter-wave applications based on a commercial 0.14-µm pHEMT technology
IEEE Transactions on Microwave Theory and Techniques, vol. 49, no. 11, pp. 2086–2092, 2001
Characterization and performance of MOCVD grown 0.14-µm InP-HEMTs for low voltage applications
Materials Science and Engineering B, vol. 74, no. 1-3, pp. 137–142, 2000
Semiconductor Science and Technology, vol. 15, no. 7, pp. 728–735, 2000
Semiconductor Science and Technology, vol. 15, no. 8, pp. 799–805, 2000
Semiconductor Science and Technology, vol. 16, no. 1, pp. 14–20, 2000
Semiconductor Science and Technology, vol. 14, no. 8, pp. 736–739, 1999
An LDMOS VHF class-E power amplifier using a high-Q novel variable inductor
IEEE Transactions on Microwave Theory and Techniques, vol. 47, no. 12, pp. 2534–2538, 1999
Characterisation and modelling of noise parameters of SiC MESFETs
Electronics Letters, vol. 35, no. 7, p. 574, 1999
Hot electron degradation effects in 0.14 µm AlInAs/GaInAs/InP HEMTs
Microelectronics Reliability, vol. 39, no. 12, pp. 1765–1771, 1999
Large signal modelling of GaAs/AlGaAs HBT's with separation of the surface recombination current
Solid-State Electronics, vol. 43, no. 12, pp. 2163–2172, 1999
Microwave performance and reliability evaluation of MOCVD-grown AlInAs/GaInAs/InP-based HEMTs
Microwave and Optical Technology Letters, vol. 20, no. 6, pp. 357–362, 1999
A new extraction method for the two-parameter FET temperature noise model
IEEE Transactions on Microwave Theory and Techniques, vol. 46, no. 11, pp. 1679–1685, 1998
An algebraic method for noise parameter analysis of temperature noise models
Microwave and Optical Technology Letters, vol. 17, no. 5, pp. 287–291, 1998
A direct extraction formula for the FET temperature noise model
Microwave and Optical Technology Letters, vol. 16, no. 4, pp. 208–212, 1997
Molecular beam epitaxy growth and characterization of InxGa1 $minus; xAs (0.57 $les; x $les; 1) on GaAs using InAlAs graded buffer
Journal of Crystal Growth, vol. 175-176, pp. 1016–1021, 1997
Accurate small-signal modeling of HFET's for millimeter-wave applications
IEEE Transactions on Microwave Theory and Techniques, vol. 44, no. 3, pp. 432–437, 1996
Extending the high-frequency limit of a single-electron transistor by on-chip impedance transformation
Physical Review B, vol. 53, no. 20, pp. R13272–R13274, 1996
Validation of a nonlinear transistor model by power spectrum characteristics of HEMT's and MESFET's
IEEE Transactions on Microwave Theory and Techniques, vol. 43, no. 5, pp. 1046–1052, 1995
Novel single device balanced resistive HEMT mixers
IEEE Transactions on Microwave Theory and Techniques, vol. 43, no. 12, pp. 2863–2867, 1995
DC and RF performance of 0.15 [micro sign]m gate length In0.70Al0.30As/In0.80Ga0.20As HFETs on GaAs substrate
Electronics Letters, vol. 31, no. 15, p. 1292, 1995
A monolithically integrated F-band resistive InAlAs/InGaAs/InP HFET mixer
IEEE Microwave and Guided Wave Letters, vol. 5, no. 11, pp. 394–395, 1995
RF characterization of Josephson flux-flow transistors: design, modeling, and on-wafer measurement
IEEE Transactions on Appiled Superconductivity, vol. 5, no. 2, pp. 3385–3388, 1995
A 40-GHz integrated quasi-optical slot HFET mixer
IEEE Transactions on Microwave Theory and Techniques, vol. 42, no. 12, pp. 2492–2497, 1994
New empirical nonlinear model for HEMT devices
Electronics Letters, vol. 28, no. 2, p. 140, 1992
On the performance of different types of MESFET-mixers
Microwave and Optical Technology Letters, vol. 4, no. 12, pp. 517–521, 1991
Temperature variable noise and electrical characteristics of Au-Ga-As Schottky barrier millimeter-wave mixer diodes
IEEE Transactions on Microwave Theory and Techniques, vol. 36, no. 11, pp. 1469–1475, 1988
Broad-Band Noise Mechanisms and Noise Measurements of Metal Semiconductor Junctions
IEEE Transactions on Microwave Theory and Techniques, vol. 34, no. 11, pp. 1193–1201, 1986
A Cryogenic Millimeter-wave Schottky-diode Mixer
IEEE Transactions on Microwave Theory and Techniques, vol. 83, no. 2, pp. 230–235, 1983
Hot-electron noise generation in gallium-arsenide Schottky-barrier diodes
Electronics Letters, vol. 19, no. 20, p. 853, 1983
Single-crystal metal-semiconductor microjunctions prepared by molecular beam epitaxy
Electronics Letters, vol. 18, no. 10, p. 424, 1982