C. Tan received his Ph.D. degree in electrical engineering from the University of Toronto, Toronto, ON, Canada, in 1992. He has 10 years of working experience in reliability in electronic industry before joining Nanyang Technological University (NTU), Singapore, as a Faculty Member in 1996 till now. He has published more than 260 international journals and conference papers and has given more than 30 invited talks in international conferences. He holds 10 patents and 1 copyright on reliability software. Tan has written 3 books and 3 book chapters in the field of reliability. He serves as the Editor of IEEE TDMR and Series Editor of Springer Briefs in Reliability. He serves as a Past Chair of IEEE Singapore Section, a Senior Member of IEEE and ASQ, a Distinguished Lecturer of IEEE Electron Devices Society on reliability, a Founding Chair of IEEE Nanotechnology Chapter (Singapore Section), a Fellow of the Institute of Engineers (Singapore), a Fellow of SQI, an Executive Council Member of SQI, a Director of SIMTech‐NTU Reliability Lab, and a Senior Scientist in SIMTech. Tan serves as the Founding Chair of IEEE International Conference on Nanoelectronics and General Chair of ANQ Congress 2014. He is also the recipient of IEEE Region 10 Outstanding Volunteer Award, in 2011. He is in the Review Board of several international journals such as Thin Solid Film and Microelectronic Reliability for more than 5 years. His research interests include reliability and failure physics modeling of electronic components and systems, finite element modeling of materials degradation, statistical modeling of engineering systems, nanomaterials and devices reliability, and prognosis and health management of engineering system.
Biography Updated on 2 December 2013