Yaqiao Wu got his Ph.D. degree in materials science and engineering at the Institute of Metal Research, Chinese Academy of Sciences, China in 2000. During his Ph.D. study, he systematically studied the structural evolution of single-crystal silicon under Vikers indentation by using high-resolution transmission electron microscopy (TEM), which includes the atomic level investigations of micromechanism of fracture and amorphization of c-Si. From 1998 to 1999, he was a Joint-Training Ph.D. Student, and from 2000 to 2002, he was an STA Fellow. In addition, he worked in National Institute for Materials Science, Japan, studying the behaviors of various microalloying elements in nanocomposite magnets using the combinatorial TEM and atom probe tomography (APT) techniques. Dr. Wu has been with Ames Laboratory of USDOE, Iowa State University, since 2002. Currently, he serves as an Assistant Scientist in the Lab. His interests are in the materials design, synthesis, property analysis, nanoscale structure, and chemistry characterization, establishing connections between microstructure, chemistry, and property by utilizing combinatorial TEM and APT techniques. Dr. Wu is or has been a Member of MRS, TMS, and Sigma Xi.
Biography Updated on 27 February 2011