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Articles in Scholarly Journals [Incomplete List]

1. IEEE Design & Test of Computers, vol. 25, no. 2, pp. 160–166, 2008
2. IEEE Transactions on Microwave Theory and Techniques, vol. 56, no. 5, pp. 1193–1200, 2008
3. IEEE Transactions on Microwave Theory and Techniques, vol. 56, no. 5, pp. 1207–1214, 2008
4. IEEE Transactions on Microwave Theory and Techniques, vol. 56, no. 6, pp. 1485–1492, 2008
5. IEEE Transactions on Microwave Theory and Techniques, vol. 56, no. 7, pp. 1555–1564, 2008
6. IEEE Transactions on Microwave Theory and Techniques, vol. 56, no. 8, pp. 1790–1796, 2008
7. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 25, no. 5, pp. 909–913, 2006
8. Bipolar Microwave RMS Power Detectors
   IEEE Journal of Solid-State Circuits, vol. 41, no. 9, pp. 2188–2192, 2006
9. Embedded Loopback Test for RF ICs
   IEEE Transactions on Instrumentation and Measurement, vol. 54, no. 5, pp. 1715–1720, 2005
10. A Translinear RMS Detector for Embedded Test Of RF ICs
    IEEE Transactions on Instrumentation and Measurement, vol. 54, no. 5, pp. 1708–1714, 2005
11. IEEE Transactions on Microwave Theory and Techniques, vol. 53, no. 4, pp. 1197–1202, 2005
12. Differential Log-Domain Filters With High-Gain Common-Mode Feedback
    IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications, vol. 51, no. 2, pp. 254–263, 2004
13. Analytical Models and Algorithms for the Efficient Signal Integrity Verification of Inductance-Effect-Prominent Multicoupled VLSI Circuit Interconnects
    IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 12, no. 4, pp. 395–407, 2004
14. A Decoupling Technique for Efficient Timing Analysis of VLSI Interconnects With Dynamic Circuit Switching
    IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 23, no. 9, pp. 1321–1337, 2004
15. A compact multilayer IC package model for efficient simulation, analysis, and design of high-performance VLSI circuits
    IEEE Transactions on Advanced Packaging, vol. 26, no. 4, pp. 392–401, 2003
16. A traveling-wave-based waveform approximation technique for the timing verification of single transmission lines
    IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 21, no. 6, pp. 723–730, 2002
17. Generalized traveling-wave-based waveform approximation technique for the efficient signal integrity verification of multicoupled transmission line system
    IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 21, no. 12, pp. 1489–1497, 2002
18. Circuit for monitoring BJT RF performance using DC measurements
    IEEE Journal of Solid-State Circuits, vol. 2, no. 9, pp. 1207–1210, 2002
19. Fast and accurate quasi-three-dimensional capacitance determination of multilayer VLSI interconnects
    IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 9, no. 3, pp. 450–460, 2001
20. Analog Integrated Circuits and Signal Processing, vol. 28, no. 1, pp. 73–82, 2001
21. A new on-chip interconnect crosstalk model and experimental verification for CMOS VLSI circuit design
    IEEE Transactions on Electron Devices, vol. 47, no. 1, pp. 129–140, 2000
22. Improvement in electrical and dielectric behavior of (Ba,Sr)TiO_{3} thin films by Ag doping
    Physical Review B, vol. 61, no. 11, pp. 7305–7307, 2000
23. Direct measurement of crosstalk between integrated differential circuits
    IEEE Transactions on Microwave Theory and Techniques, vol. 48, no. 8, pp. 1410–1413, 2000
24. LINC power amplifier combiner method efficiency optimization
    IEEE Transactions on Vehicular Technology, vol. 49, no. 1, pp. 229–234, 2000
25. New simultaneous switching noise analysis and modeling for high-speed and high-density CMOS IC package design
    IEEE Transactions on Advanced Packaging, vol. 23, no. 2, pp. 303–312, 2000
26. S-parameter-measurement-based high-speed signal transient characterization of VLSI interconnects on SiO/sub 2/-Si substrate
    IEEE Transactions on Advanced Packaging, vol. 23, no. 3, pp. 470–479, 2000
27. Accuracy estimation of mixed-mode scattering parameter measurements
    IEEE Transactions on Microwave Theory and Techniques, vol. 47, no. 1, pp. 102–105, 1999
28. Calibration and verification of the pure-mode vector network analyzer
    IEEE Transactions on Microwave Theory and Techniques, vol. 46, no. 7, pp. 1009–1012, 1998
29. Pure-mode network analyzer for on-wafer measurements of mixed-mode S-parameters of differential circuits
    IEEE Transactions on Microwave Theory and Techniques, vol. 45, no. 7, pp. 1071–1077, 1997
30. Substrate parasitics and dual-resistivity substrates [microwave integrated circuits]
    IEEE Transactions on Microwave Theory and Techniques, vol. 44, no. 7, pp. 1170–1174, 1996
31. Combined differential and common-mode analysis of power splitters and combiners
    IEEE Transactions on Microwave Theory and Techniques, vol. 43, no. 11, pp. 2627–2632, 1995
32. Generalized coupled interconnect transfer function and high-speed signal simulations
    IEEE Transactions on Microwave Theory and Techniques, vol. 43, no. 5, pp. 1115–1121, 1995
33. Combined differential and common-mode scattering parameters: theory and simulation
    IEEE Transactions on Microwave Theory and Techniques, vol. 43, no. 7, pp. 1530–1539, 1995
34. Simulations and measurements of picosecond signal transients, propagation, and crosstalk on lossy VLSI interconnect
    IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part A, vol. 18, no. 1, pp. 215–225, 1995
35. High-speed VLSI interconnect modeling based on S-parameter measurements
    IEEE Transactions on Components, Hybrids, and Manufacturing Technology, vol. 16, no. 5, pp. 555–562, 1993
36. S-parameter-based IC interconnect transmission line characterization
    IEEE Transactions on Components, Hybrids, and Manufacturing Technology, vol. 15, no. 4, pp. 483–490, 1992
37. Modelling of coupled interconnect lines for integrated circuits
    International Journal of Electronics, vol. 70, no. 4, pp. 751–764, 1991
38. A novel lossy and dispersive interconnect model for integrated circuit simulation
    IEEE Transactions on Components, Hybrids, and Manufacturing Technology, vol. 13, no. 2, pp. 275–280, 1990
39. CMOS VLSI single event transient characterization
    IEEE Transactions on Nuclear Science, vol. 36, no. 6, pp. 2287–2291, 1989
40. Optoelectronic measurements of picosecond electrical pulse propagation in coplanar waveguide transmission lines
    IEEE Transactions on Microwave Theory and Techniques, vol. 37, no. 10, pp. 1612–1619, 1989
41. Circuit modeling of collector current spreading effects in quasi-saturation for advanced bipolar transistors
    Solid-State Electronics, vol. 31, no. 12, pp. 1725–1731, 1988
42. A physics-based current-dependent base resistance mode; for advanced bipolar transistors
    IEEE Transactions on Electron Devices, vol. 35, no. 7, pp. 1055–1062, 1988
43. S-parameter measurement prediction for bipolar transistors using a physical device simulator
    IEEE Transactions on Electron Devices, vol. 35, no. 10, pp. 1633–1639, 1988
44. SPICE Simulation of SOI MOSFET Integrated Circuits
    IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 5, no. 4, pp. 653–658, 1986
45. On-Chip Picosecond Time-Domain Measurements for VLSI and Interconnect Testing Using Photoconductors
    IEEE Journal of Solid-State Circuits, vol. 20, no. 1, pp. 284–289, 1985
46. Integrated picosecond photoconductors produced on bulk Si substrates
    Applied Physics Letters, vol. 45, no. 4, p. 404, 1984
47. IEEE Transactions on Electron Devices, vol. 29, no. 4, pp. 669–675, 1982