Articles in Scholarly Journals [Incomplete List]

1. Reliability-Driven Gate Replication for Nanometer-Scale Digital Logic
   IEEE Transactions On Nanotechnology, vol. 6, no. 3, pp. 303–308, 2007
2. Simultaneous voltage scaling and gate sizing for low-power design
   IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing, vol. 49, no. 6, pp. 400–408, 2002