Isabelle Ferain graduated from Summa with the M.S. degree (cum Laude) in electrical engineering from the Faculté Polytechnique de Mons, Mons, Belgium, and from the Ecole Supérieure d’Electricité , Gif-sur-Yvette, France, in 2001. She received the Ph.D. degree in electrical engineering from the Katholieke Universiteit Leuven, Leuven, Belgium, in 2008. In 2001, she joined ON Semiconductor, Audenaarde, Belgium, where she was involved in SPC and line yield control. From 2004 to 2008, she was with IMEC, Leuven, Belgium, where she worked on the integration and electrical characterization of metal gate electrodes on fully depleted multiple-gate FETs on silicon-on-insulator. From 2008 to 2010, she was a Postdoctoral Research Fellow at the Tyndall National Institute, University College Cork, Cork, Ireland, where she worked on the fabrication and characterization of junctionless nanowire field effect transistors. She is currently involved in the coordination of several research projects dedicated to field effect transistors scaling, with the Micro-Nano Electronic Centre, Tyndall National Institute, Cork, Ireland. She has authored or coauthored more than 90 international journal and conference papers. She has coauthored 3 book chapters dedicated to low-temperature direct-wafer bonding for CMOS applications and to junctionless nanowire field effect transistors.
Biography Updated on 29 December 2011