Articles in Scholarly Journals [Incomplete List]

1. Applying the Oscillation Test Strategy to FPAA?s Configurable Analog Blocks
   Journal of Electronic Testing, vol. 21, no. 2, pp. 135–146, 2005
2. Built-in self-test of global interconnects of field programmable analog arrays
   Microelectronics Journal, vol. 36, no. 12, pp. 1112–1123, 2005
3. Reusing an on-chip network for the test of core-based systems
   ACM Transactions on Design Automation of Electronic Systems, vol. 9, no. 4, pp. 471–499, 2004
4. Searching for Global Test Costs Optimization in Core-Based Systems
   Journal of Electronic Testing, vol. 20, no. 4, pp. 357–373, 2004
5. A New FPGA for DSP Applications Integrating BIST Capabilities
   Journal of Electronic Testing, vol. 20, no. 4, pp. 423–431, 2004
6. Journal of Electronic Testing, vol. 19, no. 1, pp. 13–20, 2003
7. Testing of RF mixers with adaptive filters
   Microelectronics Journal, vol. 33, no. 10, pp. 847–853, 2002
8. Synthesis method for testable electrical networks using 1st order building blocks
   Microelectronics Journal, vol. 33, no. 10, pp. 823–834, 2002
9. Journal of Electronic Testing, vol. 17, no. 2, pp. 149–161, 2001
10. Journal of Electronic Testing, vol. 17, no. 2, pp. 121–138, 2001
11. A new adaptive analog test and diagnosis system
    IEEE Transactions on Instrumentation and Measurement, vol. 49, no. 2, pp. 223–227, 2000
12. Design of self-checking fully differential circuits and boards
    IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 8, no. 2, pp. 113–128, 2000
13. A reliable fail-safe system
    IEEE Transactions on Computers, vol. 47, no. 2, pp. 236–241, 1998
14. CAD tools and foundries to boost microsystems development
    Materials Science and Engineering B, vol. 51, no. 1-3, pp. 242–253, 1998
15. Analog checkers with absolute and relative tolerances
    IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 14, no. 5, pp. 607–612, 1995