Sam Kwong received his B.S. degree and M.A.S. degree in electrical engineering from the State University of New York at Buffalo, USA and University of Waterloo, Canada, in 1983 and 1985, respectively. In 1996, he obtained his Ph.D. degree from the University of Hagen, Germany. From 1985 to 1987, Kwong was a Diagnostic Engineer with the Control Data Canada where he designed the diagnostic software to detect the manufacture faults of the VLSI chips in the Cyber 430 machine. He later joined the Bell Northern Research Canada as a member of scientific staff. In 1990, he joined the City University of Hong Kong as a Lecturer at the Department of Electronic Engineering. He is currently an Associate Professor at the Department of Computer Science.
Biography Updated on 23 January 2011