Anil R. Chourasia

Anil R. Chourasia received his B.S. and M.S. degree from Nagpur University, India. He worked on Extended X-ray Absorption Fine Structure for his Ph.D. degree and earned the degree in 1986 from the same university. He joined East Texas State University as a Postdoctoral Fellow and subsequently became a Research Associate. He was selected as an Assistant Professor in 1996 when the university changed the name to Texas A&M University-Commerce. He got promoted to an Associate Professor and then to a Professor of physics. He has also served as the Acting Head of the Department of Physics. He has been a Visiting Scientist to the National Research Institute for Metals, Tsukuba, Japan, and Melbourne Institute of Technology, Melbourne, Australia. He has authored more than fifty research papers. His research is in the field of electron and x-ray spectroscopies. His research interests include thin films and interfaces, transition metals, rare earths, and intermetallics.

Biography Updated on 30 June 2007

Personal Home Page

http://www.tamu-commerce.edu/physics/anil/anil.html

Articles in Scholarly Journals [Incomplete List]

  1. Core Level XPS Spectra of Silicon Dioxide Using Zirconium and Magnesium Radiations
    Surface Science Spectra, vol. 13, no. 1, p. 48, 2006
  2. A study of amorphous Ti–Ni alloys by X-ray photoelectron spectroscopy
    Journal of Electron Spectroscopy and Related Phenomena, vol. 135, no. 2-3, pp. 135–141, 2004
  3. Auger parameter of hafnium in elemental hafnium and in hafnium oxide
    Surface Science, vol. 573, no. 2, pp. 320–326, 2004
  4. Composition dependence of the spin wave stiffness parameter in La1$minus;xCaxMnO3 CMR materials
    Journal of Magnetism and Magnetic Materials, vol. 226-230, pp. 775–776, 2001
  5. Auger electron appearance potential spectroscopy study of CrNx films
    Surface and Interface Analysis, vol. 31, no. 4, pp. 291–296, 2001
  6. Core Level XPS Spectra of Cr and N in Chromium Nitride Films
    Surface Science Spectra, vol. 7, no. 2, p. 150, 2000
  7. Spin dynamics and absence of a central peak anomaly in La[sub 0.67]Ca[sub 0.33]MnO[sub 3]
    Journal of Applied Physics, vol. 87, no. 9, p. 5813, 2000
  8. A study of CrNx thin films by X-ray photoelectron spectroscopy
    Journal of Electron Spectroscopy and Related Phenomena, vol. 104, no. 1-3, pp. 91–97, 1999
  9. Core Level XPS Spectra of Elemental Silicon Using Zirconium Radiation
    Surface Science Spectra, vol. 5, no. 2, p. 115, 1998
  10. A study of Si compounds by Zr La photoelectron spectroscopy
    Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, vol. 14, no. 3, p. 699, 1996
  11. Analytical Chemistry, vol. 67, no. 12, pp. 199–220, 1995
  12. Appearance potential study of PrMn2 and SmMn2 intermetallics
    Journal of Alloys and Compounds, vol. 224, no. 2, pp. 287–291, 1995
  13. X-ray photoelectron study of TiN/SiO2 and TiN/Si interfaces
    Thin Solid Films, vol. 266, no. 2, pp. 298–301, 1995
  14. A study of the electronic structure of GdMn2 by appearance potential spectroscopy (SXAPS)
    Journal of Electron Spectroscopy and Related Phenomena, vol. 70, no. 1, pp. 23–28, 1994
  15. Analytical Chemistry, vol. 65, no. 12, pp. 311–333, 1993
  16. Scanning tunneling microscopy of the electronic structure of chemical vapor deposited diamond films
    Applied Physics Letters, vol. 62, no. 16, p. 1889, 1993
  17. A Study of Si3N4 by XPS
    Surface Science Spectra, vol. 2, no. 2, p. 117, 1993
  18. X-ray Photoelectron Study of TiN
    Surface Science Spectra, vol. 1, no. 2, p. 233, 1992
  19. Study of YBaCuO on W/Si by x-ray photoelectron spectroscopy
    Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, vol. 10, no. 4, p. 1547, 1992
  20. A study of Y–Ba–Cu–O/Si interfaces by x-ray photoelectron spectroscopy
    Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, vol. 10, no. 1, p. 115, 1992
  21. Angle resolved X-ray photoemission study of CaF2/Si(111) interfaces
    Surface Science, vol. 275, no. 3, pp. 424–432, 1992
  22. Characterization of low pressure deposited diamond films by X-ray photoelectron spectroscopy
    Thin Solid Films, vol. 193-194, pp. 1079–1086, 1990
  23. X-ray photoelectron study of Al-Mn alloys
    Journal of Electron Spectroscopy and Related Phenomena, vol. 52, pp. 541–550, 1990
  24. Growth of diamond films and characterization by Raman, scanning electron microscopy, and x-ray photoelectron spectroscopy
    Journal of Materials Research, vol. 5, no. 11, Article ID 1990.2424, 8 pages, 1990
  25. Deposition of diamond films at low pressures and their characterization by positron annihilation, Raman, scanning electron microscopy, and x-ray photoelectron spectroscopy
    Applied Physics Letters, vol. 56, no. 18, p. 1781, 1990
  26. Analytical Chemistry, vol. 61, no. 12, pp. 243–269, 1989
  27. Soft-x-ray appearance potential spectroscopy study of Pr2Fe14-xCoxB
    Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, vol. 7, no. 3, p. 2075, 1989
  28. Soft X-ray appearance potential spectroscopy study of Ni-Fe alloys
    Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 40-41, pp. 376–378, 1989
  29. Appearance potential study of Nd2Fe14B
    Journal of the Less Common Metals, vol. 148, no. 1-2, pp. 413–420, 1989
  30. Soft X-ray appearance potential study of Ni74Fe26
    Surface Science, vol. 206, no. 3, pp. 484–494, 1988
  31. A study of LaH3 by auger electron appearance potential spectroscopy
    Journal of Electron Spectroscopy and Related Phenomena, vol. 43, no. 3, pp. 233–241, 1987
  32. X-ray photoelectron spectroscopy study of the Ni/Si oxide/Si interface
    Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, vol. 5, no. 6, p. 3340, 1987
  33. Study of the Ti/Si interface using x-ray photoelectron and Auger electron appearance potential spectroscopies
    Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, vol. 5, no. 4, p. 1984, 1987
  34. Study of the 4f-levels in rare earths by appearance potential spectroscopy
    Journal of Electron Spectroscopy and Related Phenomena, vol. 41, no. 1, pp. 167–173, 1986
  35. Chemical shifts of the K-absorption discontinuities of germanium and selenium in some amorphous systems
    Journal of Non-Crystalline Solids, vol. 46, no. 1, pp. 13–19, 1981