Charles E. Stroud
Charles E. Stroud was graduated from the University of Kentucky with BSEE degree in 1976 and MSEE degree in 1977. He spent 15 years at Bell Labs where he was a Distinguished Member of Technical Staff designing VLSI devices and printed circuit boards for computer telecommunications and systems. Of the 21 production VLSI devices he designed 16 incorporated Built-In Self-Test (BIST) including the first BIST for Random Access Memories, the first completely self-testing chip using Circular BIST, and the first BIST for mixed-signal systems. He received a Ph.D. degree in electrical engineering and computer science from the University of Illinois at Chicago in 1991. He left Bell Labs in 1993 and has been in academia since that time where his accomplishments include the first BIST for Field Programmable Gate Arrays. He holds 16 US patents for various BIST approaches for VLSI devices and FPGAs. He has published over 130 journal and conference papers with two best paper awards. He is author of the book entitled A Designer’s Guide to Built-In Self-Test and coeditor of a new book entitled System-on-Chip Test Architectures. He has served on the editorial boards for IEEE Transactions on VLSI Systems, IEEE Design & Test of Computers, and Journal of Electronic Testing: Theory & Applications. In addition, he has served on program committees for IEEE International Test Conference, IEEE International On-Line Test Symposium, IEEE North Atlantic Test Workshop, ACM International Symposium on Field Programmable Gate Arrays, IEEE International Application Specific Integrated Circuits Conference, and ACM/IEEE International Workshop on Hardware/Software Co-Design. He is a Member of Tau Beta Pi, Eta Kappa Nu, and a Fellow of IEEE and IEEE Computer Society.
Biography Updated on 17 January 2008