Christian Kübel studied chemistry at the University of California, Irvine, CA, USA, and the University of Mainz, Mainz, Germany, where he received his Ph.D. degree in 1998 working for Professor Klaus Muellen at the Max Planck Institute for Polymer Research. In 1999/2000 he joined Professor David Martin at the University of Michigan, Ann Arbor, MI, USA, as a Feodor‐Lynen Postdoc working on high‐resolution imaging of defects in polymers. In 2000–2004 he worked as a Senior Application Specialist for TEM at Philips/FEI, Eindhoven, NB, The Netherlands, where he contributed significantly to the development of TrueImage and Explore3D. From 2005 to 2008, he served as a Group Leader of the Nanostructure and Surface Analysis group at Fraunhofer IFAM, Bremen, Germany. Since 2009, he is a Group Leader of the Electron Microscopy and Spectroscopy group at KIT, Karlsruhe, Germany, and head of the KNMF Laboratory for Microscopy and Spectroscopy. His research interests include the development of new methods for electron microscopy such as focal series reconstruction, electron tomography, quantitative imaging techniques, and in situ mechanical and electrical testing for application in materials science such as batteries, LEDs, polymers, nanocomposites, catalysts, and bulk nanocrystalline metals. He has published more than 90 scientific papers and holds one patent.
Biography Updated on 29 November 2014