Chun-Sheng Jiang received his Ph.D. degree in condensed matter physics from theUniversity of Tokyo, Tokyo, Japan in 1995 and then joined the Institute of Physical and Chemical Research in Japan and Department of Physics, University of Texas, Austin, Tex, USA as a Postdoctoral Researcher. He joined NREL in 2001 as a Senior Scientist, and his field is scanning probe microscopy (SPM). His current primary interests are nanometer̄scale electrical characterizations of solar cell materials and devices using SPM-based techniques such as scanning Kelvin probe force microscopy, scanning capacitance microscopy, and scanning spreading resistance microscopy. He has authored or coauthored more than 100 publications.
Biography Updated on 4 November 2012