Wen-Ben Jone received the B.S. degree in computer science in 1979, the M.S. degree in computer engineering in 1981, both from National Chiao-Tung University, Hsin-Chu, Taiwan, and the Ph.D. degree in computer engineering and science from Case Western Reserve University, Cleveland, Ohio, in 1987. In 1987, he joined the Department of Computer Science at New Mexico Institute of Mining and Technology, New Mexico, where he was promoted as an Associate Professor in 1992. From 1993 to 2000, he was with the Department of Computer Engineering and Information Science, National Chung-Cheng University, Taiwan. From 2001, he has been an Associate Professor at the Department of Electrical & Computer Engineering and Computer Science, University of Cincinnati, USA. His research interests include VLSI design for testability, built-in self-testing, memory testing, high-performance circuit testing, MEMS testing and repairing, and low-power circuit design and test. He has published more than 100 papers and holds one patent (USA). Dr. Jone served as a reviewer in these research areas in various technical journals and conferences. He is also listed in the Marquis Who's Who in the World (15th edition, 1998, 2001). He also served on the program committee of VLSI Design/CAD Symposium (1993-1997, in Taiwan), was the General Chair of 1998 VLSI Design/CAD Symposium, and served on the program committee of 1995, 1996, 2000 Asian Test Conferences, 1995-1998 Asia and South Pacific Design Automation Conference, 1998 International Conference on Chip Technology, 2000, 2007 International Symposium on Defect and Fault Tolerance in VLSI Systems, and 2002, 2003 Great Lake Symposium on VLSI. He received the Best Thesis Award from The Chinese Institute of Electrical Engineering, China, in 1981. He is a Corecipient of the 2003 IEEE Donald G.Fink Prize Paper Award. He is a Senior Member of IEEE and the IEEE Computer Society Test Technology Technical Committee.
Biography Updated on 4 February 2008