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Davor Balzar
Articles in Scholarly Journals [Incomplete List]
X-ray Line Profile Analysis of Nanoparticles in Proton Exchange Membrane Fuel Cell Electrodes
Journal of Physical Chemistry C, vol. 111, no. 26, pp. 9583–9591, 2007
Tuning of Tungsten Thin Film Superconducting Transition Temperature for Fabrication of Photon Number Resolving Detectors
IEEE Transactions on Appiled Superconductivity, vol. 15, no. 2, pp. 3528–3531, 2005
Elastic-strain tensor and inhomogeneous strain in thin films by X-ray diffraction
Thin Solid Films, vol. 450, no. 1, pp. 29–33, 2004
Internal stress storage in shape memory polymer nanocomposites
Applied Physics Letters, vol. 85, no. 2, p. 290, 2004
Defect-related lattice strain and the transition temperature in ferroelectric thin films
Physical Review B, vol. 70, no. 9, 2004
Size–strain line-broadening analysis of the ceria round-robin sample
Journal of Applied Crystallography, vol. 37, no. 6, pp. 911–924, 2004
An analytical approximation for a size-broadened profile given by the lognormal and gamma distributions
Journal of Applied Crystallography, vol. 35, no. 3, pp. 338–346, 2002
Influence of Strains and Defects on Ferroelectric and Dielectric Properties of Thin-Film Barium-Strontium Titanates
Japanese Journal of Applied Physics, vol. 41, no. Part 1, No. 11B, pp. 6628–6632, 2002
Elastic strain and stress determination by Rietveld refinement: generalized treatment for textured polycrystals for all Laue classes
Journal of Applied Crystallography, vol. 34, no. 2, pp. 187–195, 2001
Growth and characterization of large area Cu(In,Ga)Se2 films
Thin Solid Films, vol. 387, no. 1-2, pp. 54–56, 2001
Fundamental studies on large area Cu(In,Ga)Se2 films for high efficiency solar cells
Solar Energy Materials and Solar Cells, vol. 70, no. 3, pp. 345–361, 2001
Silicoboron–carbonitride ceramics: A class of high-temperature, dopable electronic materials
Applied Physics Letters, vol. 78, no. 20, p. 3076, 2001
Deposition and characterization of low-loss epitaxial non-linear dielectric thin films for microwave devices
Integrated Ferroelectrics, vol. 28, no. 1, pp. 161–173, 2000
Dislocation-density changes upon poling of polycrystalline BaTiO_{3}
Physical Review B, vol. 59, no. 5, pp. 3414–3420, 1999
Acoustic study of texture in polycrystalline brass
The Journal of the Acoustical Society of America, vol. 105, no. 5, p. 2663, 1999
Nonlinear ultrasonic parameter in quenched martensitic steels
Journal of Applied Physics, vol. 83, no. 9, p. 4584, 1998
Elastic-strain tensor by Rietveld refinement of diffraction measurements
Journal of Applied Physics, vol. 84, no. 9, p. 4822, 1998
Reliability of the Simplified Integral-Breadth Methods in Diffraction Line-Broadening Analysis
Journal of Applied Crystallography, vol. 29, no. 1, pp. 16–23, 1996
Voigt-function modeling in Fourier analysis of size- and strain-broadened X-ray diffraction peaks
Journal of Applied Crystallography, vol. 26, no. 1, pp. 97–103, 1993
Profile fitting of X-ray diffraction lines and Fourier analysis of broadening
Journal of Applied Crystallography, vol. 25, no. 5, pp. 559–570, 1992