Ugur Serincan was born in Nicosia, Cyprus, in 1973. He received his B.S. degree in physics education, M.S. degree in high energy physics and Ph. D. degree in solid state physics at Middle East Technical University (METU), Ankara, Turkey, in 1996, 1998, and 2004, respectively. He served as a Research Assistant at METU from 1996 to 2004. He subsequently completed a postdoctoral position at METU in 2006. Presently, he serves as an Associate Professor in Anadolu University, Eskisehir, Turkey. Although he was excessively working on Si and Ge nanocrystals embedded in dielectric films, presently he is working on infrared detectors-based on GaAs/AlGaAs and type II supperlattice systems. He has eight and two years of experience in ion implantation system and molecular beam epitaxy system, respectively. He is interested in infrared, Raman, photoluminescence, and X-ray diffraction spectroscopy as well as scanning and transmission electron microscopy techniques.
Biography Updated on 17 April 2011