M. B. H. Breese

Personal Home Page

http://www.ciba.nus.edu.sg/CV/mbhb/CV.htm

Articles in Scholarly Journals [Incomplete List]

  1. Tunable colour emission from patterned porous silicon using ion beam writing
    Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 260, no. 1, pp. 378–383, 2007
  2. Porous silicon microcavities fabricated using ion irradiation
    Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 260, no. 1, pp. 445–449, 2007
  3. A review of transmission channelling using high-demagnification microprobes
    Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 260, no. 1, pp. 288–292, 2007
  4. Proton beam writing
    Materials Today, vol. 10, no. 6, pp. 20–29, 2007
  5. Freestanding waveguides in silicon
    Applied Physics Letters, vol. 90, no. 24, p. 241109, 2007
  6. Porous silicon Bragg reflectors with sub-micrometer lateral dimensions
    Optics Express, vol. 15, no. 9, p. 5537, 2007
  7. Hole transport through proton-irradiated p-type silicon wafers during electrochemical anodization
    Physical Review B, vol. 73, no. 3, 2006
  8. Controlled blueshift of the resonant wavelength in porous silicon microcavities using ion irradiation
    Applied Physics Letters, vol. 89, no. 2, p. 021910, 2006
  9. A study of oscillations in the angular distribution of volume reflected ions from bent crystals
    Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 252, no. 2, pp. 205–211, 2006
  10. Multicolor Photoluminescence from Porous Silicon Using Focused, High-Energy Helium Ions
    Advanced Materials, vol. 18, no. 1, pp. 51–55, 2006
  11. Fabrication of patterned porous silicon using high-energy ion irradiation
    Journal of Porous Materials, vol. 13, no. 3, pp. 259–261, 2006
  12. Proton beam writing of microstructures in silicon
    Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 231, no. 1-4, pp. 357–363, 2005
  13. An automatic beam focusing system for MeV protons
    Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 231, no. 1-4, pp. 389–393, 2005
  14. Characterisation of 60° misfit dislocations in SiGe alloy using nuclear microscopy
    Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 231, no. 1-4, pp. 452–456, 2005
  15. New developments in the applications of proton beam writing
    Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 237, no. 1-2, pp. 188–192, 2005
  16. Transmission ion channeling analysis of isolated 60° misfit dislocations
    Applied Physics Letters, vol. 87, no. 21, p. 211907, 2005
  17. International Journal of Nanoscience, vol. 4, no. 3, p. 269, 2005
  18. Controlled Shift in Emission Wavelength from Patterned Porous Silicon Using Focused Ion Beam Irradiation
    Journal of The Electrochemical Society, vol. 152, no. 10, p. D173, 2005
  19. High quality ion-induced secondary electron imaging for MeV nuclear microprobe applications
    Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, vol. 22, no. 2, p. 560, 2004
  20. Enhanced Planar Channeling of MeV Protons through Thin Crystals
    Physical Review Letters, vol. 93, no. 10, 2004
  21. Three-dimensional microfabrication in bulk silicon using high-energy protons
    Applied Physics Letters, vol. 84, no. 16, p. 3202, 2004
  22. Controlled intensity emission from patterned porous silicon using focused proton beam irradiation
    Applied Physics Letters, vol. 85, no. 19, p. 4370, 2004
  23. Digital IBIC—new spectroscopic modalities for ion-beam-induced charge imaging
    Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, vol. 521, no. 2-3, pp. 600–607, 2004
  24. A Monte Carlo simulation study of channelling and dechannelling enhancement due to lattice translations
    Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 222, no. 1-2, pp. 53–60, 2004
  25. The new Surrey ion beam analysis facility
    Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 219-220, pp. 405–409, 2004
  26. Three-dimensional micromachining of silicon using a nuclear microprobe
    Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 222, no. 3-4, pp. 513–517, 2004
  27. Characterization of thick graded Si1-xGex/Si layers grown by low energy plasma enhanced chemical vapour deposition
    Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 215, no. 1-2, pp. 235–239, 2004
  28. Stoichiometric and structural alterations in GaN thin films during annealling
    Applied Physics A: Materials Science & Processing, vol. 77, no. 1, pp. 103–108, 2003
  29. A study of the material loss and other processes involved during annealing of GaN at growth temperatures
    Chemical Physics Letters, vol. 380, no. 1-2, pp. 105–110, 2003
  30. Microscopic evaluation of spatial variations in material and charge transport properties of CdZnTe radiation detectors
    Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, vol. 512, no. 1-2, pp. 427–432, 2003
  31. The National University of Singapore high energy ion nano-probe facility: Performance tests
    Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 210, pp. 14–20, 2003
  32. High-resolution channeling contrast microscopy of compositionally graded Si1-XGeX layers
    Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 210, pp. 483–488, 2003
  33. Focusing of MeV ion beams by means of tapered glass capillary optics
    Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, vol. 21, no. 5, p. 1671, 2003
  34. Ion beam induced charge and cathodoluminescence imaging of response uniformity of CVD diamond radiation detectors
    Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, vol. 487, no. 1-2, pp. 65–70, 2002
  35. A photomultiplier-based secondary electron imaging system for a nuclear microprobe
    Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 188, no. 1-4, pp. 146–150, 2002
  36. The use of solenoid lenses in a two-stage nuclear microprobe probe-forming system
    Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 188, no. 1-4, pp. 261–266, 2002
  37. Imaging of charge transport properties in polycrystalline CVD diamond using IBIC and IBIL microscopy
    Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 181, no. 1-4, pp. 219–224, 2001
  38. An electrostatic beam rocking system on the Surrey nuclear microprobe
    Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 181, no. 1-4, pp. 54–59, 2001
  39. Characterisation of a coplanar CVD diamond radiation detector
    Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, vol. 466, no. 1, pp. 52–57, 2001
  40. Spectroscopic response of coplanar diamond alpha particle detectors
    IEEE Transactions on Nuclear Science, vol. 48, no. 6, pp. 2307–2312, 2001
  41. High-Efficiency Beam Extraction and Collimation Using Channeling in Very Short Bent Crystals
    Physical Review Letters, vol. 87, no. 9, 2001
  42. Advances in the investigation of the extraction of a proton beam from the U-70 accelerator with the aid of bent single crystals
    Journal of Experimental and Theoretical Physics Letters, vol. 74, no. 1, pp. 55–58, 2001
  43. Study of the crystalline quality of exfoliated surfaces in hydrogen-implanted silicon
    Applied Physics Letters, vol. 77, no. 2, p. 268, 2000
  44. Imaging of charge transport in polycrystalline diamond using ion-beam-induced charge microscopy
    Applied Physics Letters, vol. 77, no. 6, p. 913, 2000
  45. Micron-scale analysis of SiC/SiCf composites using the new Lisbon nuclear microprobe
    Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 161-163, pp. 334–338, 2000
  46. Bending MeV proton beams in graded composition Si1-xGex/Si layers
    Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 171, no. 3, pp. 387–400, 2000
  47. Monte Carlo simulations of a magnetic quadrupole triplet as a high resolution energy spectrometer
    Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 171, no. 4, pp. 565–572, 2000
  48. The use of a magnetic quadrupole triplet as a high resolution ion energy spectrometer
    Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 155, no. 1-2, pp. 153–159, 1999
  49. An extended magnetic quadrupole lens for a high-resolution nuclear microprobe
    Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 158, no. 1-4, pp. 48–52, 1999
  50. Ion optical study of a transmission ion microscope
    Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 158, no. 1-4, pp. 236–240, 1999
  51. Characterisation of lens aberrations and parasitic fields using beam rocking
    Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 158, no. 1-4, pp. 81–84, 1999
  52. A study of the relationship between spatial and angular coordinates of axially channeled MeV protons
    Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 159, no. 4, pp. 248–253, 1999
  53. Confirmation of proton beam bending in graded Si[sub 1-x]Ge[sub x]/Si layers using ion channeling
    Applied Physics Letters, vol. 74, no. 2, p. 227, 1999
  54. The influence of ion induced damage on lateral charge collection and IBIC image contrast
    Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 136-138, pp. 1349–1354, 1998
  55. A comparison between the use of EBIC and IBIC microscopy for semiconductor defect analysis
    Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 136-138, pp. 1355–1360, 1998
  56. Maskless fabrication of 3-dimensional microstructures in PMMA using a nuclear microprobe
    Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 136-138, pp. 379–384, 1998
  57. Strain and defect imaging in thin crystals using a nuclear microprobe
    Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 136-138, pp. 23–34, 1998
  58. Transmission ion microscopy using a quadrupole triplet as an objective lens
    Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 134, no. 3-4, pp. 431–434, 1998
  59. Defect imaging using convergent beam ion channeling patterns
    Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 140, no. 1-2, pp. 178–184, 1998
  60. An optimised beam rocking system to produce angle-resolved information from small areas
    Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 140, no. 1-2, pp. 199–208, 1998
  61. Detection of small lattice strains using beam rocking on a nuclear microprobe
    Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 136-138, pp. 1240–1243, 1998
  62. Phase space analysis of planar channeled MeV protons
    Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 145, no. 3, pp. 346–353, 1998
  63. Equivalent Effects of a Lattice Translation and Rotation on Planar Channeled MeV Protons
    Physical Review Letters, vol. 81, no. 23, pp. 5157–5160, 1998
  64. Heavy ion and proton beams in high resolution imaging of a fungi spore specimen using STIM tomography
    Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 130, no. 1-4, pp. 230–236, 1997
  65. The Schonland Micro-Scanning Ion Beam Analysis Facility
    Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 130, no. 1-4, pp. 37–44, 1997
  66. Dislocation imaging of an InAlGaAs opto-electronic modulator using IBICC
    Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 130, no. 1-4, pp. 551–556, 1997
  67. A beam rocking system for the Oxford nuclear microprobe: A new approach to channeling analysis
    Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 129, no. 4, pp. 534–542, 1997
  68. A study of channeling patterns from strained Si1-xGex/Si bilayers close to <011> axes
    Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 129, no. 4, pp. 511–518, 1997
  69. Direct observation of lattice strain in Si1-xGex/Si crystals using planar channeling patterns
    Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 132, no. 1, pp. 177–187, 1997
  70. Beam bending using graded composition strained layers
    Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 132, no. 3, pp. 540–547, 1997
  71. Defect imaging and channeling studies using channeling scanning transmission ion microscopy
    Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 118, no. 1-4, pp. 426–430, 1996
  72. Multiple beam ion channeling patterns
    Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 114, no. 3-4, pp. 252–258, 1996
  73. Imaging of the strain field around precipitate particles using transmission ion channeling
    Journal of Applied Physics, vol. 80, no. 5, p. 2671, 1996
  74. Observation of planar oscillations of MeV protons in silicon using ion channeling patterns
    Physical Review B, vol. 53, no. 13, pp. 8267–8276, 1996
  75. Characterization of strain in crystal bilayers using ion-channeling patterns
    Physical Review B, vol. 54, no. 14, pp. 9693–9702, 1996
  76. The use of ‘‘mixed’’ beams in microprobe imaging
    Review of Scientific Instruments, vol. 67, no. 8, p. 2940, 1996
  77. A review of ion beam induced charge microscopy for integrated circuit analysis
    Materials Science and Engineering: B, vol. 42, no. 1-3, pp. 67–76, 1996
  78. Ion beam induced charge microscopy for the analysis of integrated circuits
    Advanced Materials, vol. 7, no. 10, pp. 873–875, 1995
  79. Observation of a Blocking to Channeling Transition for MeV Protons at Stacking Faults in Silicon
    Physical Review Letters, vol. 74, no. 3, pp. 411–414, 1995
  80. Advances of nuclear microscopy in microelectronics analysis
    Vacuum, vol. 44, no. 3-4, pp. 175–180, 1993