Isao Takayanagi
Micron Japan, Ltd., Japan

Articles in Scholarly Journals [Incomplete List]

  1. A 1.25-inch 60-Frames/s 8.3-M-Pixel Digital-Output CMOS Image Sensor
    IEEE Journal of Solid-State Circuits, vol. 40, no. 11, pp. 2305–2314, 2005
  2. Dark current reduction in stacked-type CMOS-APS for charged particle imaging
    IEEE Transactions on Electron Devices, vol. 50, no. 1, pp. 70–76, 2003
  3. Noise characteristics of stacked CMOS active pixel sensor for charged particles
    Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, vol. 470, no. 3, pp. 512–519, 2001
  4. Output characteristics of stacked CMOS-type active pixel sensor for charged particles
    Surface and Interface Analysis, vol. 31, no. 2, pp. 131–137, 2001
  5. Dimensions of schizophrenic positive symptoms: an exploratory factor analysis investigation
    European Archives of Psychiatry and Clinical Neuroscience, vol. 248, no. 3, pp. 130–135, 1998
  6. Amplified MOS imager for soft X-ray imaging
    IEEE Transactions on Electron Devices, vol. 42, no. 8, pp. 1425–1432, 1995
  7. A 250 k-pixel SIT image sensor operating in its high-sensitivity mode
    IEEE Transactions on Electron Devices, vol. 38, no. 5, pp. 1021–1027, 1991
  8. Analysis of operational speed and scaling down the pixel size of a charge modulation device (CMD) image sensor
    IEEE Transactions on Electron Devices, vol. 38, no. 5, pp. 999–1004, 1991
  9. The operation mechanism of a charge modulation device (CMD) image sensor
    IEEE Transactions on Electron Devices, vol. 38, no. 5, pp. 989–998, 1991