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Isao Takayanagi
Micron Japan, Ltd., Japan
Articles in Scholarly Journals [Incomplete List]
A 1.25-inch 60-Frames/s 8.3-M-Pixel Digital-Output CMOS Image Sensor
IEEE Journal of Solid-State Circuits, vol. 40, no. 11, pp. 2305–2314, 2005
Dark current reduction in stacked-type CMOS-APS for charged particle imaging
IEEE Transactions on Electron Devices, vol. 50, no. 1, pp. 70–76, 2003
Noise characteristics of stacked CMOS active pixel sensor for charged particles
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, vol. 470, no. 3, pp. 512–519, 2001
Output characteristics of stacked CMOS-type active pixel sensor for charged particles
Surface and Interface Analysis, vol. 31, no. 2, pp. 131–137, 2001
Dimensions of schizophrenic positive symptoms: an exploratory factor analysis investigation
European Archives of Psychiatry and Clinical Neuroscience, vol. 248, no. 3, pp. 130–135, 1998
Amplified MOS imager for soft X-ray imaging
IEEE Transactions on Electron Devices, vol. 42, no. 8, pp. 1425–1432, 1995
A 250 k-pixel SIT image sensor operating in its high-sensitivity mode
IEEE Transactions on Electron Devices, vol. 38, no. 5, pp. 1021–1027, 1991
Analysis of operational speed and scaling down the pixel size of a charge modulation device (CMD) image sensor
IEEE Transactions on Electron Devices, vol. 38, no. 5, pp. 999–1004, 1991
The operation mechanism of a charge modulation device (CMD) image sensor
IEEE Transactions on Electron Devices, vol. 38, no. 5, pp. 989–998, 1991