Gongyuan Qu
Gongyuan Qu received his B.S. and M.S.
degrees in computer engineering from the
Harbin Institute of Technology, China, in
1982 and 1985, respectively, and Ph.D. degree
in computer engineering from Santa
Clara University in 2002. As a software principal
engineer and part-time researcher, he
has worked with several Silicon Valley companies
on development of image processing
and machine vision software, IC diagnostic
tools, defect inspection machines, and defect image and IC yield
management systems. His research interests include machine vision,
image processing, industrial defect detection and database application
to image analysis.
Biography Updated on 12 March 2002
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