Articles in Scholarly Journals [Incomplete List]

1. X-ray reflectometry analyses of chromium thin films
   Thin Solid Films, vol. 515, no. 4, pp. 1286–1293, 2006
2. Win X-ray: A New Monte Carlo Program that Computes X-ray Spectra Obtained with a Scanning Electron Microscope
   Microscopy and Microanalysis, vol. 12, no. 01, p. 49, 2006
3. New Measurements of Deconvoluted EDS Spectra of Elemental Standards as a Function of Atomic Number and Electron Beam Energy
   Microscopy and Microanalysis, vol. 12, no. S02, p. 830, 2006
4. Generation of Spurious X-rays by Focused Ion Beams in Dual Beam Instruments
   Microscopy and Microanalysis, vol. 12, no. S02, p. 1250, 2006
5. Measurements of relative x-ray line intensities and their application to a single standard procedure for quantitative x-ray microanalysis
   Journal of Applied Physics, vol. 100, no. 12, p. 124312, 2006
6. Theoretical Effect of Thin Films on the Detectability of Elements in the Substrate by X-Ray Microanalysis
   Microscopy and Microanalysis, vol. 10, no. S02, 2004
7. Considerations for Three Dimensional Imaging In the Crossbeam FIB
   Microscopy and Microanalysis, vol. 10, no. S02, 2004
8. X-Ray Microanalysis of Real Materials Using Monte Carlo Simulations
   Microchimica Acta, vol. 145, no. 1-4, pp. 41–47, 2004
9. Microstructural and compositional analysis of YBa2Cu3O7$minus;$delta; films grown by MOCVD before and after GCIB smoothing
   Physica C: Superconductivity, vol. 405, no. 3-4, pp. 179–186, 2004
10. Microstructural and electrical characterization of gas cluster ion beam-smoothed YBCO films
    IEEE Transactions on Appiled Superconductivity, vol. 13, no. 2, pp. 2470–2473, 2003