Jürgen Härtwig

Articles in Scholarly Journals [Incomplete List]

  1. In-Situ and Real-Time Analysis of the Formation of Strains and Microstructure Defects during Solidification of Al-3.5 Wt Pct Ni Alloys
    Metallurgical and Materials Transactions A, vol. 39, no. 4, pp. 865–874, 2008
  2. In situ and real-time analysis of TGZM phenomena by synchrotron X-ray radiography
    Journal of Crystal Growth, 2008
  3. In-Situ and Real-Time Investigation of Columnar-to-Equiaxed Transition in Metallic Alloy
    Metallurgical and Materials Transactions A, vol. 38, no. 7, pp. 1458–1464, 2007
  4. Real-time andin situ solidification of Al-based alloys investigated by synchrotron radiation: a unique experimental set-up combining radiography and topography techniques
    physica status solidi (a), vol. 204, no. 8, pp. 2721–2727, 2007
  5. Structural defects in homoepitaxial diamond layers grown on off-axis Ib HPHT substrates
    physica status solidi (a), vol. 203, no. 12, pp. 3056–3062, 2006
  6. An x-ray topographic study of diamond anvils: Correlation between defects and helium diffusion
    Journal of Applied Physics, vol. 99, no. 10, p. 104906, 2006
  7. In situ observation of pore evolution during melting and solidification of Al–Pd–Mn quasicrystals by synchrotron X-ray radiography
    Philosophical Magazine, vol. 86, no. 3-5, pp. 335–340, 2006
  8. Czochralski growth and X-ray topographic characterization of decagonal AlCoNi quasicrystals
    Philosophical Magazine, vol. 86, no. 3-5, pp. 317–322, 2006
  9. Synchrotron X-ray diffractometry and imaging of strains and defects in icosahedral quasicrystal grains
    Philosophical Magazine, vol. 86, no. 36, pp. 5897–5908, 2006
  10. In situ and real-time probing of quasicrystal solidification dynamics by synchrotron imaging
    Physical Review E, vol. 74, no. 3, 2006
  11. Origin of the Opalescence at the a-ß Transition of Quartz: Role of the Incommensurate Phase Studied by Synchrotron Radiation
    Physical Review Letters, vol. 94, no. 15, 2005
  12. In situ analysis of equiaxed growth of aluminium–nickel alloys by x-ray radiography at ESRF
    Journal of Physics D: Applied Physics, vol. 38, no. 10A, pp. A28–A32, 2005
  13. Quantitative comparison between two phase contrast techniques: diffraction enhanced imaging and phase propagation imaging
    Physics in Medicine and Biology, vol. 50, no. 4, pp. 709–724, 2005
  14. Revealing the structural disturbances in Czochralski silicon by high temperature–pressure treatment
    Journal of Alloys and Compounds, vol. 401, no. 1-2, pp. 64–68, 2005
  15. Application of synchrotron X-ray imaging to the study of directional solidification of aluminium-based alloys
    Journal of Crystal Growth, vol. 275, no. 1-2, pp. 201–208, 2005
  16. Investigation of residual dislocations in VGF-grown Si-doped GaAs
    Journal of Crystal Growth, vol. 276, no. 3-4, pp. 335–346, 2005
  17. Extended investigation of porosity in quasicrystals by synchrotron X-ray phase contrast radiography—I: In icosahedral AlPdMn grains
    Journal of Crystal Growth, vol. 281, no. 2-4, pp. 623–638, 2005
  18. Extended investigation of porosity in quasicrystals by synchrotron X-ray phase contrast radiography: Part II, in grains of other alloys and structures than AlPdMn
    Journal of Crystal Growth, vol. 282, no. 1-2, pp. 228–235, 2005
  19. Types and origin of dislocations in large GaAs and InP bulk crystals with very low dislocation densities
    physica status solidi (a), vol. 202, no. 15, pp. 2870–2879, 2005
  20. Investigation of columnar–equiaxed transition and equiaxed growth of aluminium based alloys by X-ray radiography
    Materials Science and Engineering: A, vol. 413-414, pp. 384–388, 2005
  21. Structures prepared by implantation of silicon with nitrogen and annealing under high hydrostatic pressure
    Materials Science in Semiconductor Processing, vol. 7, no. 4-6, pp. 399–403, 2004
  22. Pressure-induced defect structure changes in thin AlGaAs layers
    Journal of Alloys and Compounds, vol. 362, no. 1-2, pp. 254–260, 2004
  23. Modification of the SOI-like structures by annealing under high hydrostatic pressure
    Journal of Alloys and Compounds, vol. 362, no. 1-2, pp. 269–274, 2004
  24. Influence of high pressure and temperature on defect structure of silicon crystals implanted with N or Si ions
    Journal of Alloys and Compounds, vol. 362, no. 1-2, pp. 275–281, 2004
  25. Characterization of dislocations in protein crystals by means of synchrotron double-crystal topography
    Journal of Applied Crystallography, vol. 37, no. 1, pp. 67–71, 2004
  26. In situ study of the annealing behavior of porosity in icosahedral Al-Pd-Mn quasicrystals using third generation x-ray synchrotron radiation imaging
    Physical Review B, vol. 69, no. 14, 2004
  27. High Resolution Imaging as a Characterization Tool for Biological Crystals
    Annals of the New York Academy of Sciences, vol. 1027, no. 1, pp. 48–55, 2004
  28. Degree of structural perfection of icosahedral quasicrystalline grains investigated by synchrotron X-ray diffractometry and imaging techniques
    Philosophical Magazine, vol. 83, no. 1, pp. 1–29, 2003
  29. X-ray imaging of surface acoustic waves generated in semiconductor crystals by an external transducer
    Applied Physics Letters, vol. 82, no. 9, p. 1374, 2003
  30. A method to extract quantitative information in analyzer-based x-ray phase contrast imaging
    Applied Physics Letters, vol. 82, no. 20, p. 3421, 2003
  31. Hybrid and effective satellites for studying superlattices
    Microelectronics Journal, vol. 34, no. 5-8, pp. 695–699, 2003
  32. X-ray “magnifying” imaging investigation of giant Burgers vector micropipe-dislocations in 4H-SiC
    Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 200, pp. 323–328, 2003
  33. Stress-induced structural changes in thin InAs layers grown on GaAs substrate
    Crystal Research and Technology, vol. 38, no. 35, pp. 302–306, 2003
  34. X-ray Diffraction Topography at a Synchrotron Radiation Source Applied to the Study of Bonded Silicon on Insulator Material
    Crystal Research and Technology, vol. 37, no. 7, p. 705, 2002
  35. X-ray diffraction imaging investigation of silicon carbide on insulator structures
    Applied Physics A: Materials Science & Processing, vol. 75, no. 5, pp. 621–627, 2002
  36. On the structure of epitaxial YHx films
    Journal of Alloys and Compounds, vol. 330-332, no. 1-2, pp. 276–279, 2002
  37. Present state and perspectives of synchrotron radiation diffraction imaging
    Journal of Synchrotron Radiation, vol. 9, no. 3, pp. 107–114, 2002
  38. Applications of dynamical diffraction under locally plane wave conditions: defects in nearly perfect crystals and X-ray refractometry
    Acta Crystallographica Section A Foundations of Crystallography, vol. 57, no. 5, pp. 526–530, 2001
  39. Three-dimensional imaging of crystal defects by `topo-tomography'
    Journal of Applied Crystallography, vol. 34, no. 5, pp. 602–607, 2001
  40. Journal of Physics D: Applied Physics, vol. 34, no. 10A, pp. A47–A51, 2001
  41. Journal of Physics D: Applied Physics, vol. 34, no. 10A, pp. A70–A77, 2001
  42. Journal of Physics D: Applied Physics, vol. 34, no. 10A, pp. A98–A102, 2001
  43. Journal of Physics D: Applied Physics, vol. 34, no. 10A, pp. A103–A108, 2001
  44. Microstructure of Czochralski silicon annealed at enhanced stress conditions
    Journal of Alloys and Compounds, vol. 328, no. 1-2, pp. 90–96, 2001
  45. A Bragg silicon lattice comparator
    IEEE Transactions on Instrumentation and Measurement, vol. 50, no. 2, pp. 608–611, 2001
  46. Phase imaging using highly coherent X-rays: radiography, tomography, diffraction topography
    Journal of Synchrotron Radiation, vol. 7, no. 3, pp. 196–201, 2000
  47. Effect of annealing on the structural perfection of Al–Pd–Mn icosahedral quasicrystal grains
    Materials Science and Engineering A, vol. 294-296, no. 1-2, pp. 57–60, 2000
  48. µm-resolved high resolution X-ray diffraction imaging for semiconductor quality control
    Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 160, no. 4, pp. 521–527, 2000
  49. Dislocations in dendritic web silicon
    Journal of Crystal Growth, vol. 213, no. 3-4, pp. 288–298, 2000
  50. X-ray Topographic Investigation of Quartz Single Crystals at High Temperature, up to 1185°C
    Crystal Research and Technology, vol. 35, no. 2, pp. 207–212, 2000
  51. In situ x-ray diffraction topography studies on the phase formation in thin yttrium hydride films
    Physical Review B, vol. 62, no. 3, pp. 2164–2172, 2000
  52. Theory of moiré fringes on X-ray diffraction topographs of bicrystals
    Acta Crystallographica Section A Foundations of Crystallography, vol. 55, no. 3, pp. 413–422, 1999
  53. X-ray diffraction moiré topography as a means to reconstruct relative displacement fields in weakly deformed bicrystals
    Acta Crystallographica Section A Foundations of Crystallography, vol. 55, no. 3, pp. 423–432, 1999
  54. Diffraction topography using white X-ray beams with low effective divergence
    Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences, vol. 357, no. 1761, pp. 2741–2754, 1999
  55. Journal of Physics D: Applied Physics, vol. 32, no. 10A, pp. A88–A91, 1999
  56. Journal of Physics D: Applied Physics, vol. 32, no. 10A, pp. A152–A159, 1999
  57. Analysis of types of residual dislocations in the VGF growth of GaAs with extremely low dislocation density (EPD$z.Lt;1000cm$minus;2)
    Journal of Crystal Growth, vol. 198-199, pp. 367–373, 1999
  58. Rapid growth of hybrid organic–inorganic crystals for nonlinear optics
    Journal of Crystal Growth, vol. 204, no. 3, pp. 325–332, 1999
  59. X-ray imaging and diffraction from surface phonons on GaAs
    Applied Physics Letters, vol. 75, no. 12, p. 1709, 1999
  60. Reduction of elastic strains in directly-bonded silicon structures
    Physics of the Solid State, vol. 41, no. 11, pp. 1790–1798, 1999
  61. Conserving the Coherence and Uniformity of Third-Generation Synchrotron Radiation Beams: the Case of ID19, a `Long' Beamline at the ESRF
    Journal of Synchrotron Radiation, vol. 5, no. 5, pp. 1243–1249, 1998
  62. Complementary observations of defects in quasicrystals by X-ray topography and electron microscopy
    Physica B: Condensed Matter, vol. 253, no. 1-2, pp. 61–67, 1998
  63. High-resolution x-ray diffraction and high-resolution scanning electron microscopy studies of Si-based structures with a buried amorphous layer
    Journal of Applied Physics, vol. 84, no. 11, p. 6076, 1998
  64. Investigation of structural defects and inhomogeneities in Al-Pd-Mn icosahedral quasicrystals by combined synchrotron X-ray topography and phase radiography
    Philosophical Magazine A, vol. 78, no. 5, pp. 1175–1194, 1998
  65. Moiré Fringes and/or Translation-Fault Fringes?
    Acta Crystallographica Section A Foundations of Crystallography, vol. 53, no. 2, pp. 199–201, 1997
  66. Ka_{1,2} and Kß_{1,3} x-ray emission lines of the 3d transition metals
    Physical Review A, vol. 56, no. 6, pp. 4554–4568, 1997
  67. Threading dislocations in silicon layer produced by separation by implanted oxygen process
    Journal of Applied Physics, vol. 80, no. 4, p. 2113, 1996
  68. X-ray Moiré Topography on SIMOX Structures
    Journal of Applied Crystallography, vol. 29, no. 5, pp. 568–573, 1996
  69. New Features of Dislocation Images in Third-Generation Synchrotron Radiation Topographs
    Journal of Synchrotron Radiation, vol. 3, no. 4, pp. 173–184, 1996
  70. X-Ray Topographic Contrast of Threading Dislocations in Silicon on Insulator Structures
    Physica Status Solidi (a), vol. 158, no. 1, pp. 19–34, 1996
  71. Synchrotron white beam topographic investigation of crystalline defects in silicon on insulator materials
    Journal of Crystal Growth, vol. 166, no. 1-4, pp. 329–333, 1996
  72. Stress-induced oxygen precipitation in Cz$z.sbnd;Si
    Materials Science and Engineering B, vol. 36, no. 1-3, pp. 30–32, 1996
  73. Comparison of lattice parameters obtained from an internal silicon monocrystal standard
    Physica Status Solidi (a), vol. 142, no. 1, pp. 19–26, 1994
  74. Remeasurement of characteristic X-ray emission lines and their application to line profile analysis and lattice parameter determination
    Physica Status Solidi (a), vol. 143, no. 1, pp. 23–34, 1994
  75. Remeasurement of the profile of the characteristic Cu Ka emission line with high precision and accuracy
    Journal of Applied Crystallography, vol. 26, no. 4, pp. 539–548, 1993
  76. Plane wave topography on crystals with step-like impurity distributions
    Czechoslovak Journal of Physics, vol. 35, no. 2, pp. 158–167, 1985