Articles in Scholarly Journals [Incomplete List]

1. EBIST: a novel test generator with built-in fault detection capability
   IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 24, no. 9, pp. 1457–1466, 2005
2. LPRAM: A Novel Low-Power High-Performance RAM Design With Testability and Scalability
   IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 23, no. 5, pp. 637–651, 2004
3. A BIST pattern generator design for near-perfect fault coverage
   IEEE Transactions on Computers, vol. 52, no. 12, pp. 1543–1557, 2003