Xiaoqing Wen received the B.E. degree from the Tsinghua University, China, in 1986, the M.E. degree from the Hiroshima University, Japan, in 1990, and the Ph.D. degree from the Osaka University, Japan, in 1993. From 1993 to 1997, he was an Assistant Professor at the Akita University, Japan. He was a Visiting Researcher at the University of Wisconsin-Madison, USA, from October 1995 to March 1996. He joined the SynTest Technologies, Inc., USA, in 1998 and served as its Chief Technology Officer until 2003. In 2004, he joined the Kyushu Institute of Technology, Japan, where he is currently a Full Professor and served as the Chair of the Department of Creative Informatics in 2008 and 2009. Dr. Wen’s research interests include test, testable design, and diagnosis of VLSI circuits. He currently holds 31 US patents and 3 Japan patents in built-in self-test, test compression, and low-power test generation. He received the 2008 Society Best Paper Award from the Institute of Electronics, Information and Communication Engineers-Information and Systems Society for his pioneering work in low-capture power test generation. He coauthored/coedited two books: VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann, 2006) and Power-Aware Testing and Test Strategies for Low Power Devices (Springer, 2009). He is the Cochair of the Technical Activity Committee on Power-Aware Testing, Test Technology Technical Council of IEEE Computer Society. He was also the Program Committee Cochair of the Sixteenth IEEE Asian Test Symposium and the Eighth IEEE Workshop on RTL and High Level Testing. He has served on numerous program committees, including IEEE/ACM Design Automation Conference, IEEE International Test Conference, and IEEE European Test Symposium. He is the Associate Editor for the Journal of Computer Science and Technology and the Journal of VLSI and Electronic System Design. Dr. Wen is a Senior Member of IEEE and a Member of the IEICE, the IPSJ, and the REAJ.
Biography Updated on 1 December 2011