Tung Ming Pan was born in Taipei, Taiwan, 1970. He received the B.S. degree from the Department of Electronics Engineering, National Chiao-Tung University (NCTU), Taiwan, in 1997 and the Ph.D. degree from the Institute of Electronics, NCTU, in 2001. From 2000 to 2002, he joined the LOGIC Development Department, Technology and Process Development Division (TD), United Microelectronics Corporation (UMC), as a Principal Engineer. He was engaged in developing the 0.1um device and process. Then, he transferred to the Reliability Engineering, Quality and Reliability Assurance Division. He was responsible to the 0.1um device reliability and quality. In 2002, he joined the Mixed Signal team of Elansat Technical Corporation as a Senior Engineer. He was engaged to design high-speed analog-to-digital converter (ADC) and digital-to-analog converter (DAC). In 2004, he joined the faculty at Chang Gung University as an Assistant Professor in the Department of Electronics Engineering and became a Professor in 2009. He has published more than 130 SCI journal papers, and he is author or coauthor of 6 patents. His current research areas focus on the high-k gate dielectric materials, nonvolatile memories, thin-film transistors (TFTs), nano-CMOS devices and technologies, reliability of semiconductor devices, biosensor materials, and devices. He won the first prize of the Lam Ph.D. Dissertation Award in 2001.
Biography Updated on 13 August 2012