Jye-Chyi Lu

Jye-Chyi (JC) Lu received his Ph.D. degree in statistics in 1988 at the University of Wisconsin and was a Professor in the Department of Statistics at North Carolina State University from 1988 to 1999. Now, he is a Professor in the School of Industrial and Systems Engineering at Georgia Institute of Technology. Dr. Lu’s has about 58 disciplinary and interdisciplinary publications appeared in both engineering and statistics journals. Currently, he is the Editor-in-Chief for the International Journal of Quality, Statistics and Reliability (IJQSR) and an Associate Editor for IEEE Transactions on Reliability and Journal of Quality Technology. His research areas cover industrial statistics, signal processing, semiconductor and electronic manufacturing, data mining and a few new topics such as supply-chain management, logistics planning, and nanotechnology.

Biography Updated on 3 June 2007

Articles in Scholarly Journals [Incomplete List]

  1. Data-reduction method for spatial data using a structured wavelet model
    International Journal of Production Research, vol. 45, no. 10, pp. 2295–2311, 2007
  2. Wavelet-based SPC procedure for complicated functional data
    International Journal of Production Research, vol. 44, no. 4, pp. 729–744, 2006
  3. IEEE Transactions on Automation Science and Engineering, vol. 3, no. 4, pp. 344–359, 2006
  4. A Vertical-Energy-Thresholding Procedure for Data Reduction With Multiple Complex Curves
    IEEE Transactions on Systems, Man and Cybernetics, Part B (Cybernetics), vol. 36, no. 5, pp. 1128–1138, 2006
  5. Reliability Modeling in Spatially Distributed Logistics Systems
    IEEE Transactions on Reliability, vol. 55, no. 3, pp. 525–534, 2006
  6. Bayesian analysis of zero-inflated regression models
    Journal of Statistical Planning and Inference, vol. 136, no. 4, pp. 1360–1375, 2006
  7. Quasi-likelihood estimation for GLM with random scales
    Journal of Statistical Planning and Inference, vol. 136, no. 2, pp. 401–429, 2006
  8. Wavelet-Based Data Reduction Techniques for Process Fault Detection
    Technometrics, vol. 48, no. 1, pp. 26–40, 2006
  9. In Situ Selectivity and Thickness Monitoring During Selective Silicon Epitaxy Using Quadrupole Mass Spectrometry and Wavelets
    IEEE Transactions on Semiconductor Manufacturing, vol. 18, no. 1, pp. 112–121, 2005
  10. Optimal Automatic Control of Multistage Production Processes
    IEEE Transactions on Semiconductor Manufacturing, vol. 18, no. 1, pp. 94–103, 2005
  11. ASYMPTOTIC DISTRIBUTIONS OF SEMIPARAMETRIC MAXIMUM LIKELIHOOD ESTIMATORS WITH ESTIMATING EQUATIONS FOR GROUP-CENSORED DATA
    Australian New Zealand Journal of Statistics, vol. 47, no. 2, pp. 173–192, 2005
  12. A network flow approach in finding maximum likelihood estimate of high concentration regions
    Computational Statistics & Data Analysis, vol. 46, no. 1, pp. 33–56, 2004
  13. Thresholded scalogram and its applications in process fault detection
    Applied Stochastic Models in Business and Industry, vol. 19, no. 3, pp. 231–244, 2003
  14. Focused local learning with wavelet neural networks
    IEEE Transactions on Neural Networks, vol. 13, no. 2, pp. 304–319, 2002
  15. Scientometrics, vol. 53, no. 3, pp. 351–370, 2002
  16. A wavelet-based procedure for process fault detection
    IEEE Transactions on Semiconductor Manufacturing, vol. 15, no. 1, pp. 79–90, 2002
  17. Semi-parametric modelling and likelihood estimation with estimating equations
    Australian New Zealand Journal of Statistics, vol. 44, no. 2, pp. 193–212, 2002
  18. Optimum percentile estimating equations for nonlinear random coefficient models
    Journal of Statistical Planning and Inference, vol. 97, no. 2, pp. 275–292, 2001
  19. Parameter Estimation for Bivariate Shock Models with Singular Distribution for Censored Data with Concomitant Order Statistics
    Australian New Zealand Journal of Statistics, vol. 42, no. 3, pp. 323–336, 2000
  20. Modeling restricted bivariate censored lowflow data
    Environmetrics, vol. 10, no. 2, pp. 125–136, 1999
  21. Lifetime Data Analysis, vol. 5, no. 2, pp. 173–183, 1999
  22. Multivariate Zero-Inflated Poisson Models and Their Applications
    Technometrics, vol. 41, no. 1, p. 29, 1999
  23. The asymptotics of maximum-likelihood estimates of parameters based on a data type where the failure and the censoring time are dependent
    Statistics & Probability Letters, vol. 36, no. 4, pp. 379–391, 1998
  24. Achieving Uniformity in a Semiconductor Fabrication Process Using Spatial Modeling
    Journal of the American Statistical Association, vol. 93, no. 441, p. 36, 1998
  25. Parametric nonstationary correlation models
    Statistics & Probability Letters, vol. 40, no. 3, pp. 267–278, 1998
  26. A new device design methodology for manufacturability
    IEEE Transactions on Electron Devices, vol. 45, no. 3, pp. 634–642, 1998
  27. Asymptotic properties of maximum likelihood estimates for a bivariate exponential distribution and mixed censored data
    Metrika, vol. 48, no. 2, pp. 109–125, 1998
  28. A new plan for life-testing two-component parallel systems
    Statistics & Probability Letters, vol. 34, no. 1, pp. 19–32, 1997
  29. Statistical Inference of a Time-to-Failure Distribution Derived from Linear Degradation Data
    Technometrics, vol. 39, no. 4, p. 391, 1997
  30. Improved Within-Wafer Uniformity Modeling Through the Use of Maximum-Likelihood Estimation of the Mean and Covariance Surfaces
    Journal of The Electrochemical Society, vol. 143, no. 10, p. 3404, 1996
  31. Analysis of Bivariate Censored Low Flows
    Journal of Hydraulic Engineering, vol. 122, no. 2, p. 97, 1996
  32. A robust metric for measuring within-wafer uniformity
    IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part C, vol. 19, no. 4, pp. 283–289, 1996
  33. Process characterization and optimization based on censored data from highly fractionated experiments
    IEEE Transactions on Reliability, vol. 43, no. 1, pp. 145–155, 1994
  34. Hierarchical yield estimation of large analog integrated circuits
    IEEE Journal of Solid-State Circuits, vol. 28, no. 3, pp. 203–209, 1993
  35. Weibull extensions of the Freund and Marshall-Olkin bivariate exponential models
    IEEE Transactions on Reliability, vol. 38, no. 5, pp. 615–619, 1989