Pascal Fouillat

Articles in Scholarly Journals [Incomplete List]

  1. In-depth resolution for LBIC technique by two-photon absorption
    Semiconductors, vol. 41, no. 4, pp. 371–375, 2007
  2. A Radiation-Hardened Injection Locked Oscillator Devoted to Radio-Frequency Applications
    IEEE Transactions on Nuclear Science, vol. 53, no. 4, pp. 2040–2046, 2006
  3. Laser Mapping of SRAM Sensitive Cells: A Way to Obtain Input Parameters for DASIE Calculation Code
    IEEE Transactions on Nuclear Science, vol. 53, no. 4, pp. 1863–1870, 2006
  4. Influence of Laser Pulse Duration in Single Event Upset Testing
    IEEE Transactions on Nuclear Science, vol. 53, no. 4, pp. 1799–1805, 2006
  5. Radiation Hardened by Design RF Circuits Implemented in 0.13 <formula formulatype="inline"><tex>$\mu$</tex></formula>m CMOS Technology
    IEEE Transactions on Nuclear Science, vol. 53, no. 6, pp. 3449–3454, 2006
  6. Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation
    Microelectronics and Reliability, vol. 46, no. 9-11, pp. 1514–1519, 2006
  7. Impact of semiconductors material on IR Laser Stimulation signal
    Microelectronics and Reliability, vol. 45, no. 9-11, pp. 1465–1470, 2005
  8. Implementing Laser-Based Failure Analysis Methodologies Using Test Vehicles
    IEEE Transactions on Semiconductor Manufacturing, vol. 18, no. 2, pp. 279–288, 2005
  9. Time-Resolved Scanning of Integrated Circuits With a Pulsed Laser: Application to Transient Fault Injection in an ADC
    IEEE Transactions on Instrumentation and Measurement, vol. 53, no. 4, pp. 1227–1231, 2004
  10. International Journal of High Speed Electronics and Systems, vol. 14, no. 2, p. 327, 2004
  11. Investigation of Millisecond-Long Analog Single-Event Transients in the LM6144 Op Amp
    IEEE Transactions on Nuclear Science, vol. 51, no. 6, pp. 3529–3536, 2004
  12. Effects of Beam Spot Size on the Correlation Between Laser and Heavy Ion SEU Testing
    IEEE Transactions on Nuclear Science, vol. 51, no. 6, pp. 3708–3715, 2004
  13. Understanding the effects of NIR laser stimulation on NMOS transistor
    Microelectronics Reliability, vol. 44, no. 9-11, pp. 1675–1680, 2004
  14. Investigation of SEU sensitivity of Xilinx Virtex II FPGA by pulsed laser fault injections
    Microelectronics Reliability, vol. 44, no. 9-11, pp. 1709–1714, 2004
  15. A physical approach on SCOBIC investigation in VLSI
    Microelectronics Reliability, vol. 43, no. 1, pp. 173–177, 2003
  16. Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization
    Microelectronics Reliability, vol. 43, no. 3, pp. 439–444, 2003
  17. Characterization of ESD induced defects using Photovoltaic Laser Stimulation (PLS)
    Microelectronics Reliability, vol. 43, no. 9-11, pp. 1577–1582, 2003
  18. Low-cost backside laser test method to pre-characterize the COTS IC?s sensitivity to Single Event Effects.
    Microelectronics Reliability, vol. 43, no. 9-11, pp. 1615–1619, 2003
  19. Test structures for analyzing proton radiation effects in bipolar technologies
    IEEE Transactions on Semiconductor Manufacturing, vol. 16, no. 2, pp. 253–258, 2003
  20. Investigation of single-event transients in voltage-controlled oscillators
    IEEE Transactions on Nuclear Science, vol. 50, no. 6, pp. 2081–2087, 2003
  21. Evaluation of a design methodology dedicated to dose-rate-hardened linear integrated circuits
    IEEE Transactions on Nuclear Science, vol. 49, no. 3, pp. 1468–1473, 2002
  22. Single-event sensitivity of a single SRAM cell
    IEEE Transactions on Nuclear Science, vol. 49, no. 3, pp. 1486–1490, 2002
  23. Backside SEU laser testing for commercial off-the-shelf SRAMs
    IEEE Transactions on Nuclear Science, vol. 49, no. 6, pp. 2977–2983, 2002
  24. A VLSI CMOS delay oriented waveform converter for polyphase frequency synthesizer
    IEEE Journal of Solid-State Circuits, vol. 37, no. 3, pp. 336–341, 2002
  25. Theoretical Investigation of an Equivalent Laser LET
    Microelectronics Reliability, vol. 41, no. 9-10, pp. 1513–1518, 2001
  26. Front Side and Backside OBIT Mappings applied to Single Event Transient Testing
    Microelectronics Reliability, vol. 41, no. 9-10, pp. 1471–1476, 2001
  27. HiperLAN 5.4-GHz low-power CMOS synchronous oscillator
    IEEE Transactions on Microwave Theory and Techniques, vol. 49, no. 9, pp. 1525–1530, 2001
  28. Backside laser testing of ICs for SET sensitivity evaluation
    IEEE Transactions on Nuclear Science, vol. 48, no. 6, pp. 2193–2201, 2001
  29. Laser cross section measurement for the evaluation of single-event effects in integrated circuits
    Microelectronics Reliability, vol. 40, no. 8-10, pp. 1371–1375, 2000
  30. SPICE modeling of the transient response of irradiated MOSFETs
    IEEE Transactions on Nuclear Science, vol. 47, no. 3, pp. 508–513, 2000
  31. Modeling BJT radiation response with non-uniform energy distributions of interface traps
    IEEE Transactions on Nuclear Science, vol. 47, no. 3, pp. 514–518, 2000
  32. Application of laser testing in study of SEE mechanisms in 16-Mbit DRAMs
    IEEE Transactions on Nuclear Science, vol. 47, no. 6, pp. 2392–2399, 2000
  33. Calculation of heavy ion induced leakage current in n-MOSFETs
    IEEE Transactions on Nuclear Science, vol. 47, no. 6, pp. 2656–2661, 2000
  34. Minimizing gain degradation in lateral PNP bipolar junction transistors using gate control
    IEEE Transactions on Nuclear Science, vol. 46, no. 6, pp. 1652–1659, 1999
  35. Validation of radiation hardened designs by pulsed laser testing and SPICE analysis
    Microelectronics Reliability, vol. 39, no. 6-7, pp. 931–935, 1999
  36. Using artificial neural networks or Lagrange interpolation to characterize the faults in an analog circuit: an experimental study
    IEEE Transactions on Instrumentation and Measurement, vol. 48, no. 5, pp. 932–938, 1999
  37. Total dose effects on gate controlled lateral PNP bipolar junction transistors
    IEEE Transactions on Nuclear Science, vol. 45, no. 6, pp. 2577–2583, 1998
  38. Implementation of total dose effects in the bipolar junction transistor Gummel-Poon model
    IEEE Transactions on Nuclear Science, vol. 44, no. 6, pp. 1922–1929, 1997
  39. Numerical modelling of mechanisms involved in latchup triggering by a laser beam
    IEEE Transactions on Nuclear Science, vol. 43, no. 3, pp. 944–951, 1996
  40. Analysis of Latchup susceptibility to internal logical states by using a Laser beam
    Microelectronic Engineering, vol. 31, no. 1-4, pp. 79–86, 1996
  41. Implementation of laser beam sensitive cells: A new approach for integrated circuits testing
    Quality and Reliability Engineering International, vol. 10, no. 4, pp. 273–277, 1994
  42. Logic state analysis using a laser beam
    Microelectronic Engineering, vol. 16, no. 1-4, pp. 287–294, 1992
  43. Asics failure analysis using two complementary techniques: External electrical testing and internal contactless laser beam testing
    Quality and Reliability Engineering, vol. 8, no. 3, pp. 213–217, 1992