Louis Scudiero

Washington State University, USA

FIELD OF EXPERTISE • Scanning Probe Microscopy (AFM, STM) • X-ray Photoelectron, Auger and Ultraviolet Photoelectron Spectroscopy techniques (XPS, UPS and AES) • Scanning Electron Microscopy and Energy Dispersive Spectroscopy (SEM, EDS) • Differential Scanning Calorimeter and Thermal gravimetric Analysis (DSC, TGA) • Infrared and Raman spectroscopy • Vacuum technology

Biography Updated on 16 February 2012

Scholarly Contributions [Data Provided by scopus]

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