E. Meyer
Ernst Meyer is a Professor at the Department of Physics, University of Basel. His main activities are in the field of nanomechanics, with emphasis on nanotribology. Novel instruments, such as the ultrahigh vacuum force microscope, are developed in his group.
Biography Updated on 8 August 2007
Personal Home Page
http://www.physik.unibas.ch/
Articles in Scholarly Journals [Incomplete List]
- Nanofriction: Skating on hot surfaces
Nature Materials, vol. 6, no. 3, Article ID nmat1854, 1 pages, 2007 - Force microscopy: Magnetic tips probe the nanoworld
Nature Nanotechnology, vol. 2, no. 5, Article ID nnano.2007.115, 1 pages, 2007 - Resonator combined with a piezoelectric actuator for chemical analysis by force microscopy
Review of Scientific Instruments, vol. 78, no. 6, p. 063709, 2007 - Force microscopy experiments with ultrasensitive cantilevers
Nanotechnology, vol. 17, no. 7, pp. S189–S194, 2006 - A tunnelling displacement sensor based on a squeezable molecular bilayer
Nanotechnology, vol. 17, no. 9, pp. 2242–2245, 2006 - Atomic-Scale Control of Friction by Actuation of Nanometer-Sized Contacts
Science, vol. 313, no. 5784, pp. 207–210, 2006 - Fluctuations and jump dynamics in atomic friction experiments
Physical Review B, vol. 72, no. 24, 2005 - Fabrication and evaluation of single-crystal silicon cantilevers with ultra-low spring constants
Journal of Micromechanics and Microengineering, vol. 15, no. 11, pp. 2179–2183, 2005 - A versatile instrument for in situ combination of scanning probe microscopy and time-of-flight mass spectrometry
Review of Scientific Instruments, vol. 76, no. 10, p. 103701, 2005 - Switchable cantilever for a time-of-flight scanning force microscope
Applied Physics Letters, vol. 84, no. 9, p. 1558, 2004 - Transition from Stick-Slip to Continuous Sliding in Atomic Friction: Entering a New Regime of Ultralow Friction
Physical Review Letters, vol. 92, no. 13, 2004 - Cu-TBPP and PTCDA molecules on insulating surfaces studied by ultra-high-vacuum non-contact AFM
Nanotechnology, vol. 15, no. 2, pp. S91–S96, 2004 - Distance dependence of force and dissipation in non-contact atomic force microscopy on Cu(100) and Al(111)
Nanotechnology, vol. 15, no. 2, pp. S101–S107, 2004 - Atomic structure of alkali halide surfaces
Applied Physics A: Materials Science & Processing, vol. 78, no. 6, pp. 837–841, 2004 - Nano Letters, vol. 4, no. 11, pp. 2185–2189, 2004
- Temperature dependence of the force sensitivity of silicon cantilevers
Physical Review B, vol. 69, no. 4, 2004 - Friction and wear on the atomic scale
Wear, vol. 254, no. 9, pp. 859–862, 2003 - Switchable cantilever fabrication for a novel time-of-flight scanning force microscope
Microelectronic Engineering, vol. 67-68, pp. 635–643, 2003 - The Cu(1 0 0)-c(2$times;2) N structure studied by combined nc-AFM/STM
Applied Surface Science, vol. 210, no. 1-2, pp. 43–48, 2003 - Ripple formation induced in localized abrasion
Physical Review B, vol. 68, no. 11, 2003 - Lateral-force measurements in dynamic force microscopy
Physical Review B, vol. 65, no. 16, 2002 - Multiple label-free biodetection and quantitative DNA-binding assays on a nanomechanical cantilever array
Proceedings of the National Academy of Sciences, vol. 99, no. 15, pp. 9783–9788, 2002 - Label-free protein assay based on a nanomechanical cantilever array
Nanotechnology, vol. 14, no. 1, pp. 86–90, 2002 - Nanotribology
CHIMIA International Journal for Chemistry, vol. 56, no. 10, pp. 562–565, 2002 - Journal of Physics: Condensed Matter, vol. 13, no. 31, pp. R619–R642, 2001
- Nanoscale fracture studies using the scanning force microscope
Applied Physics Letters, vol. 78, no. 17, p. 2485, 2001 - Atomic-resolution images of radiation damage in KBr
Surface Science, vol. 474, no. 1-3, pp. L197–L202, 2001 - Frenkel defect interactions at surfaces of irradiated alkali halides studied by non-contact atomic-force microscopy
Surface Science, vol. 482-485, pp. 903–909, 2001 - Tribology Letters, vol. 10, no. 1/2, pp. 51–56, 2001
- Tribology Letters, vol. 11, no. 2, pp. 107–110, 2001
- Carbon nanotubes as tips in non-contact SFM
Applied Surface Science, vol. 157, no. 4, pp. 269–273, 2000 - Using higher flexural modes in non-contact force microscopy
Applied Surface Science, vol. 157, no. 4, pp. 337–342, 2000 - Molecular dynamics simulations of dynamic force microscopy: applications to the Si(111)-7×7 surface
Applied Surface Science, vol. 157, no. 4, pp. 355–360, 2000 - Finite element calculations and fabrication of cantilever sensors for nanoscale detection
Ultramicroscopy, vol. 82, no. 1-4, pp. 69–77, 2000 - A cantilever array-based artificial nose
Ultramicroscopy, vol. 82, no. 1-4, pp. 1–9, 2000 - Langmuir, vol. 16, no. 25, pp. 9694–9696, 2000
- Dynamic force microscopy across steps on the Si(111)-(7×7) surface
Surface Science, vol. 461, no. 1-3, pp. 255–265, 2000 - Dynamics of damped cantilevers
Review of Scientific Instruments, vol. 71, no. 7, p. 2772, 2000 - Nanotechnology, vol. 11, no. 3, pp. 169–172, 2000
- Separation of interactions by noncontact force microscopy
Physical Review B, vol. 61, no. 16, pp. 11151–11155, 2000 - Experimental aspects of dissipation force microscopy
Physical Review B, vol. 62, no. 20, pp. 13674–13679, 2000 - Dynamic force microscopy of copper surfaces: Atomic resolution and distance dependence of tip-sample interaction and tunneling current
Physical Review B, vol. 62, no. 24, pp. 16944–16949, 2000 - Atomically resolved edges and kinks of NaCl islands on Cu(111): Experiment and theory
Physical Review B, vol. 62, no. 3, pp. 2074–2084, 2000 - Translating Biomolecular Recognition into Nanomechanics
Science, vol. 288, no. 5464, pp. 316–318, 2000 - Velocity Dependence of Atomic Friction
Physical Review Letters, vol. 84, no. 6, pp. 1172–1175, 2000 - Atomic-scale stick-slip processes on Cu(111)
Physical Review B, vol. 60, no. 16, pp. R11301–R11304, 1999 - Ferroelectric domain characterisation and manipulation : A challenge for scanning probe microscopy
Ferroelectrics, vol. 222, pp. 153–162, 1999 - Ultrathin films of NaCl on Cu(111): a LEED and dynamic force microscopy study
Surface Science, vol. 438, no. 1-3, pp. 289–296, 1999 - An artificial nose based on a micromechanical cantilever array
Analytica Chimica Acta, vol. 393, no. 1-3, pp. 59–65, 1999 - Surface morphology, chemical contrast, and ferroelectric domains in TGS bulk single crystals differentiated with UHV non-contact force microscopy
Applied Surface Science, vol. 140, no. 3-4, pp. 253–258, 1999 - Phase variation experiments in non-contact dynamic force microscopy using phase locked loop techniques
Applied Surface Science, vol. 140, no. 3-4, pp. 287–292, 1999 - Langmuir, vol. 15, no. 23, pp. 8184–8188, 1999
- Surface potential studies of self-assembling monolayers using Kelvin probe force microscopy
Surface and Interface Analysis, vol. 27, no. 5-6, pp. 368–373, 1999 - Aspects of dynamic force microscopy on NaCl/Cu(111): resolution, tip-sample interactions and cantilever oscillation characteristics
Surface and Interface Analysis, vol. 27, no. 5-6, pp. 462–466, 1999 - Micromechanical thermogravimetry
Chemical Physics Letters, vol. 294, no. 4-5, pp. 363–369, 1998 - Fuzzy controlled feedback applied to a combined scanning tunneling and force microscope
Applied Physics Letters, vol. 72, no. 1, p. 25, 1998 - Sequential position readout from arrays of micromechanical cantilever sensors
Applied Physics Letters, vol. 72, no. 3, p. 383, 1998 - Surface Stress in the Self-Assembly of Alkanethiols on Gold
Science, vol. 276, no. 5321, pp. 2021–2024, 1997 - Surface Review and Letters, vol. 4, no. 5, p. 1025, 1997
- Thermal analysis using a micromechanical calorimeter
Applied Physics Letters, vol. 69, no. 1, p. 40, 1996 - Friction forces on hydrogen passivated (110) silicon and silicon dioxide studied by scanning force microscopy
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, vol. 14, no. 2, p. 1255, 1996 - Influence of humidity on friction measurements of supported MoS2 single layers
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, vol. 14, no. 2, p. 1264, 1996 - Friction on the atomic scale: An ultrahigh vacuum atomic force microscopy study on ionic crystals
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, vol. 14, no. 2, p. 1280, 1996 - Site-specific friction force spectroscopy
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, vol. 14, no. 2, p. 1285, 1996 - Nanotechnology, vol. 7, no. 4, pp. 340–344, 1996
- Scanning probe microscopy for nanometer inspections and industrial applications
Microelectronic Engineering, vol. 32, no. 1-4, pp. 389–409, 1996 - Nanotribology: an UHV-SFM study on thin films of C60 and AgBr
Surface Science, vol. 338, no. 1-3, pp. 247–260, 1995 - Tribology of ultra-thin MoS2 platelets on mica: studies by scanning force microscopy
Thin Solid Films, vol. 240, no. 1-2, pp. 101–104, 1994 - Wear, friction and sliding speed correlations on Langmuir-Blodgett films observed by atomic force microscopy
Thin Solid Films, vol. 240, no. 1-2, pp. 105–109, 1994 - An atomic force microscopy study of corona-treated polypropylene films
Applied Surface Science, vol. 64, no. 3, pp. 197–203, 1993 - Plate-like microcrystals of silver bromide investigated by scanning force microscopy
Ultramicroscopy, vol. 41, no. 4, pp. 435–439, 1992 - Structure and dynamics of solid surfaces observed by atomic force microscopy
Ultramicroscopy, vol. 42-44, pp. 274–280, 1992 - Atomic surface and lattice structures of AgBr thin films
Ultramicroscopy, vol. 42-44, pp. 290–297, 1992 - Molecular surface structure of organic crystals observed by atomic force microscopy
Ultramicroscopy, vol. 42-44, pp. 983–988, 1992 - Ambient-pressure scanning probe microscopy of 2D regular protein arrays
Ultramicroscopy, vol. 42-44, pp. 1118–1124, 1992 - Scan control and data acquisition for bidirectional force microscopy
Ultramicroscopy, vol. 42-44, pp. 1580–1584, 1992 - Cleavage faces of alkaline earth fluorides studied by atomic force microscopy
Surface Science, vol. 277, no. 1-2, pp. L29–L33, 1992 - Friction force microscopy of mixed Langmuir-Blodgett films
Thin Solid Films, vol. 220, no. 1-2, pp. 132–137, 1992 - Molecular-resolution images of Langmuir–Blodgett films using atomic force microscopy
Nature, vol. 349, no. 6308, Article ID 349398a0, 2 pages, 1991 - Atomic force microscopy for the study of tribology and adhesion
Thin Solid Films, vol. 181, no. 1-2, pp. 527–544, 1989