Way Kuo

Articles in Scholarly Journals [Incomplete List]

  1. Identification of control chart patterns using wavelet filtering and robust fuzzy clustering
    Journal of Intelligent Manufacturing, vol. 18, no. 3, pp. 343–350, 2007
  2. Model-based clustering for integrated circuit yield enhancement
    European Journal of Operational Research, vol. 178, no. 1, pp. 143–153, 2007
  3. Recent Advances in Optimal Reliability Allocation
    IEEE Transactions on Systems, Man, and Cybernetics - Part A: Systems and Humans, vol. 37, no. 2, pp. 143–156, 2007
  4. Multi-Path Heuristic for Redundancy Allocation: The Tree Heuristic
    IEEE Transactions on Reliability, vol. 55, no. 1, pp. 37–43, 2006
  5. Reliability redundancy allocation: An improved realization for nonconvex nonlinear programming problems
    European Journal of Operational Research, vol. 171, no. 1, pp. 24–38, 2006
  6. Charge trapping and dielectric relaxation in connection with breakdown of high-k gate dielectric stacks
    Applied Physics Letters, vol. 88, no. 20, p. 202904, 2006
  7. Breakdown phenomena of zirconium-doped hafnium oxide high-k stack with an inserted interface layer
    Applied Physics Letters, vol. 89, no. 7, p. 072901, 2006
  8. Detection and classification of defect patterns on semiconductor wafers
    IIE Transactions, vol. 38, no. 12, pp. 1059–1068, 2006
  9. Multi-Path Approach for Reliability-Redundancy Allocation Using a Scaling Method
    Journal of Heuristics, vol. 11, no. 3, pp. 201–217, 2005
  10. On the Relationship of Semiconductor Yield and Reliability
    IEEE Transactions on Semiconductor Manufacturing, vol. 18, no. 3, pp. 422–429, 2005
  11. Some Considerations on System Burn-in
    IEEE Transactions on Reliability, vol. 54, no. 2, pp. 207–214, 2005
  12. International Journal of Reliability, Quality and Safety Engineering, vol. 11, no. 3, p. 197, 2004
  13. Dielectric Relaxation and Breakdown Detection of Doped Tantalum Oxide High-k Thin Films
    IEEE Transactions on Device and Materials Reliability, vol. 4, no. 3, pp. 488–494, 2004
  14. Optimal Allocation of Minimal & Perfect Repairs Under Resource Constraints
    IEEE Transactions on Reliability, vol. 53, no. 2, pp. 193–199, 2004
  15. A unified model incorporating yield, burn-in, and reliability
    Naval Research Logistics, vol. 51, no. 5, pp. 704–719, 2004
  16. A relation model of gate oxide yield and reliability
    Microelectronics Reliability, vol. 44, no. 3, pp. 425–434, 2004
  17. A general model of heterogeneous system lifetimes and conditions for system burn-in
    Naval Research Logistics, vol. 50, no. 4, pp. 364–380, 2003
  18. Percentile Life and Reliability As Performance Measures in Optimal System Design
    IIE Transactions, vol. 35, no. 12, pp. 1133–1142, 2003
  19. International Journal of Flexible Manufacturing Systems, vol. 15, no. 2, pp. 151–165, 2003
  20. Journal of Heuristics, vol. 8, no. 2, pp. 155–171, 2002
  21. Performability of FMS based on stochastic process models
    International Journal of Production Research, vol. 39, no. 1, pp. 139–155, 2001
  22. ATP-Dependent Proteases Degrade Their Substrates by Processively Unraveling Them from the Degradation Signal
    Molecular Cell, vol. 7, no. 3, pp. 627–637, 2001
  23. IIE Transactions, vol. 33, no. 12, pp. 1071–1079, 2001
  24. Burn-in effect on yield
    IEEE Transactions on Electronics Packaging Manufacturing, vol. 23, no. 4, pp. 293–299, 2000
  25. An annotated overview of system-reliability optimization
    IEEE Transactions on Reliability, vol. 49, no. 2, pp. 176–187, 2000
  26. Reliability optimization of coherent systems
    IEEE Transactions on Reliability, vol. 49, no. 3, pp. 323–330, 2000
  27. Optimal allocation of s-identical, multi-functional spares in a series system
    IEEE Transactions on Reliability, vol. 48, no. 2, pp. 118–126, 1999
  28. An overview of manufacturing yield and reliability modeling for semiconductor products
    Proceedings of the IEEE, vol. 87, no. 8, pp. 1329–1344, 1999
  29. Modeling manufacturing yield and reliability
    IEEE Transactions on Semiconductor Manufacturing, vol. 12, no. 4, pp. 485–492, 1999
  30. Structure importance of consecutive-k-out-of-n systems
    Operations Research Letters, vol. 25, no. 2, pp. 101–107, 1999
  31. Optimal pricing for a target profit: Case study on a veterinary diagnostic laboratory
    International Journal of Production Economics, vol. 54, no. 1, pp. 77–86, 1998
  32. Performability of systems based on renewal process models
    IEEE Transactions on Systems, Man, and Cybernetics - Part A: Systems and Humans, vol. 28, no. 5, pp. 691–698, 1998
  33. A nonparametric Bayes approach to decide system burn-in time
    Naval Research Logistics, vol. 44, no. 7, pp. 655–671, 1997
  34. Solutions to a modified tool loading problem for a single FMM
    International Journal of Production Research, vol. 35, no. 8, pp. 2253–2268, 1997
  35. A nonparametric approach to estimate system burn-in time
    IEEE Transactions on Semiconductor Manufacturing, vol. 9, no. 3, pp. 461–467, 1996
  36. Modeling and maximizing burn-in effectiveness
    IEEE Transactions on Reliability, vol. 44, no. 1, pp. 19–25, 1995
  37. An exploratory study of a neural network approach for reliability data analysis
    Quality and Reliability Engineering International, vol. 11, no. 2, pp. 107–112, 1995
  38. Use of the dirichlet process for reliability analysis
    Computers & Industrial Engineering, vol. 27, no. 1-4, pp. 339–343, 1994
  39. Physical simulation of a three dimensional palletizing heuristic
    International Journal of Production Research, vol. 32, no. 5, pp. 1159–1171, 1994
  40. A COMPLIANCE MEASURE FOR THE ALIGNMENT OF CYLINDRICAL PART FEATURES
    IIE Transactions, vol. 26, no. 1, pp. 2–10, 1994
  41. Simulating transient-state system effectiveness for human-machine systems
    IEEE Transactions on Reliability, vol. 43, no. 4, pp. 569–574, 1994
  42. THREE DIMENSIONAL PALLETIZATION OF MIXED BOX SIZES
    IIE Transactions, vol. 25, no. 4, pp. 64–75, 1993
  43. Application and analysis for a consecutive-k-out-of-n:G structure
    Reliability Engineering & System Safety, vol. 33, no. 2, pp. 189–197, 1991
  44. Design and performance analysis of consecutive-K-out-of-n structure
    Naval Research Logistics, vol. 37, no. 2, pp. 203–230, 1990
  45. Stochastic effectiveness models for human-machine systems
    IEEE Transactions on Systems, Man, and Cybernetics, vol. 20, no. 4, pp. 826–834, 1990
  46. Optimization limits in improving system reliability
    IEEE Transactions on Reliability, vol. 39, no. 1, pp. 51–60, 1990
  47. A consecutive-k-out-of-n:G system: the mirror image of a consecutive-k-out-of-n:F system
    IEEE Transactions on Reliability, vol. 39, no. 2, pp. 244–253, 1990
  48. Optimal design for software reliability and development cost
    IEEE Journal on Selected Areas in Communications, vol. 8, no. 2, pp. 276–282, 1990
  49. Burn-in optimization under reliability and capacity restrictions
    IEEE Transactions on Reliability, vol. 38, no. 2, pp. 193–198, 1989
  50. A practical approach to scheduling a multistage, multiprocessor flow-shop problem
    International Journal of Production Research, vol. 27, no. 10, pp. 1733–1742, 1989
  51. Analytical approximation to the queuing model: (HE3/HE3/1):(GD/8/8) for maintainability
    Microelectronics and Reliability, vol. 28, no. 1, pp. 59–73, 1988
  52. Simulation properties of the Bayesian and maximum likelihood estimators of availability
    Microelectronics and Reliability, vol. 24, no. 6, pp. 1057–1068, 1984
  53. A review of error propagation analysis in systems
    Microelectronics and Reliability, vol. 23, no. 2, pp. 235–248, 1983
  54. Software reliability estimation: A realization of competing risk
    Microelectronics and Reliability, vol. 23, no. 2, pp. 249–260, 1983