Texture
Volume 1 (1972), Issue 2, Pages 111-115
http://dx.doi.org/10.1155/TSM.1.111

X-Ray Analysis of a Quartz Fabric From the Sambagawa Crystalline Schist, Japan

1Institute of Geology and Mineralogy, Faculty of Science, Hiroshima University, Hiroshima, 730, Japan
2Mineralogischex Institut der Technischen Hochschule Darmstadt, 61 Darmstadt, Germany

Received 29 February 1972; Accepted 8 June 1972

Copyright © 1972 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

An X-ray fabric analysis of quartz grains from the Sambagawa crystalline schist, Japan, whose c-axis fabric (optically measured) was regarded as corresponding to an ultimate steady-state pattern of preferred orientation of c-axes developed by the approximately non-rotational two-dimensional strain under the Sambagawa metamorphicconditions, has been made by a texture goniometer for reflection. It has been clarified that [0001] and [101¯] directions are preferably oriented in the plane of the longest and shortest principal axes of the strain ellipsoid of mean strain of the system concerned and at the angles of ca. 35° and ca. 17° to the shortest principal axis respectively.