Editorial Board

• Lionel Aigouy, Ecole Supérieure de Physique et de Chimie Industrielles de la ville de Paris, France
• Mohammad S. Alam, University of South Alabama, USA
• Sacharia Albin, Norfolk State University, USA
• Jose A. Alvarez-Chavez, Instituto Politécnico Nacional (IPN), Mexico
• Claude Amra, Institut Fresnel, France
• Vishal Anand, The College at Brockport, USA
• David R. Andersen, University of Iowa, USA
• Oleg L. Antipov, Russian Academy of Science, Russia
• Javid Atai, University of Sydney, Australia
• Morten Bache, Università degli Studi dell'Insubria, Italy
• Fadi Baida, Université de Franche-Comté, France
• Yuri O. Barmenkov, Centro de Investigaciones en Optica, Mexico
• Alexander Baryshev, Toyohashi University of Technology, Japan
• Gaetano Bellanca, University of Ferrara, Italy
• Pierre-Alexandre Blanche, University of Arizona, USA
• Antonella Bogoni, Consorzio Nazionale Interuniversitario per le Telecomunicazioni, Italy
• Adonis Bogris, University of Athens, Greece
• Mohamed Bouazaoui, Université des Sciences et Technologies de Lille, France
• Guido Brusa, University of Arizona, USA
• Juan M. Bueno, Universidad de Murcia, Spain
• Stefano Cabrini, Lawrence Berkeley National Laboratory, USA
• Manuel P. Cagigal, Universidad de Cantabria, Spain
• Yangjian Cai, Soochow University, China
• Nicola Calabretta, Technische Universiteit Eindhoven, The Netherlands
• Luis Carretero, Universidad Miguel Hernandez, Spain
• Hau Ping Chan, City University of Hong Kong, Hong Kong
• Nanguang Chen, National University of Singapore (NUS), Singapore
• Chii Chang Chen, National Central University, Taiwan
• Xianfeng Chen, Shanghai Jiao Tong University, China
• Zhihao Chen, Institute for Infocomm Research, Agency for Science, Technology and Research, Singapore
• Jyh Long Chern, Power Lens Technology, Inc., Taiwan
• Duk Yong Choi, Laser Physics centre/The Australian National University, Australia
• Alessandro Ciattoni, CNR-SPIN Consiglio Nazionale delle Ricerche, Italy
• Dan Cojoc, Istituto Officina dei Materiali IOM-CNR, Italy
• Guangwei Cong, National Institute of Advanced Industrial Science and Technology (AIST), Japan
• Aaron Danner, National University of Singapore (NUS), Singapore
• Vincent Daria, Australian National University, Australia
• Christiano de Matos, Universidade Presbiteriana Mackenzie, Brazil
• Aditya K. Dharmadhikari, Tata Institution of Fundamental Research, India
• Luis Armando Diaz-Torres, Centro de Investigaciones en Optica AC, Mexico
• Arnaud Dubois, Université Paris-Sud 11, France
• Bernard Dussardier, Nice Sophia Antipolis University, France
• Abdulhakem Y. Elezzabi, University of Alberta, Canada
• Mady Elias, Université P.M. Curie (Paris VI), France
• Simone Esposito, Arcetri Astrophysical Observatory, Italy
• Leonardo Fallani, Università degli Studi di Firenze, Italy
• Mark Farries, Gooch and Housego, United Kingdom
• Eugenio Fazio, Università di Roma, Italy
• Didier Felbacq, University of Montpellier 2, France
• Antonio Fimia, Universidad Miguel Hernández de Elche, Spain
• Christophe Finot, Université de Bourgogne, France
• Orlando Frazão, Universidade do Porto, Portugal
• Sergi Gallego, University of Alicante, Spain
• Phillippe Gallion, Telecom ParisTech, France
• Robert C. Gauthier, Laurentian University, Canada
• Frédéric Genty, L'École Supérieure d'Électricité, France
• Goëry Genty, Tampere University of Technology, Finland
• Nirmalya Ghosh, Indian Institute of Science Education and Research-Kolkata, India
• John M. Girkin, University of Durham, United Kingdom
• Mattias Goksör, University of Gothenburg, Sweden
• Juan María Gonzalez-Leal, Universidad de Cádiz, Spain
• Artur S. Gouveia-Neto, Universidade Federal Rural de Pernambuco, Brazil
• Boris Gralak, Institut Fresnel, France
• Gerard Granet, Université Blaise Pascal, Clermont-Ferrand, France
• Frederic Grillot, Institut National des Sciences Appliquées, France
• Bai-Ou Guan, Jinan University, China
• Brahim Guizal, University of Montpellier 2, France
• Banshi D. Gupta, Indian Institute of Technology Delhi, India
• Byoung S. Ham, Inha University, Korea
• Young-Geun Han, Hanyang University, Korea
• Kazuhiro Hane, Tohoku University, Japan
• Joachim Herrmann, Max-Born-Institut FüR Nichtlineare Optik Und Kurzzeitspektroskopie, Germany
• Masaaki Hirano, Sumitomo Electric Industries, ltd., Japan
• Dag R. Hjelme, Norwegian University of Science and Technology (NTNU), Norway
• Keang-Po Ho, Silicon Image, USA
• Maarten D. Hoogerland, University of Auckland, New Zealand
• Minglie Hu, Tianjin University, China
• Rongqing Hui, The University of Kansas, USA
• Kyo Inoue, Osaka University, Japan
• Marcelo David Iturbe-Castillo, Instituto Nacional de Astrofisica Optica y Electronica, Mexico
• Roland Jäger, Philips, Germany
• Ravinder K. Jain, The University of New Mexico, USA
• Min Yong Jeon, Chungnam National University, Republic of Korea
• Jichai Jeong, korea University, Korea
• Eric G. Johnson, Clemson University, USA
• Toshikuni Kaino, Tohoku University, Japan
• Jae Wook Kang, Korea Institute of Materials Science (KIMS), Korea
• Luciana Reyes Pires Kassab, Faculdade de Tecnologia de São Paulo -CEETEPS, Brazil
• Yoshimasa Kawata, Shizuoka University, Japan
• Vincent Kermene, Institut de Recherche (XLIM), France
• Svetlana N. Khonina, Image Processing Systems Institute, Russian Academy of Sciences, Russia
• Dug Young Kim, Yonsei University, Korea
• Jeha Kim, Electronics and Telecommunications Research Institute, Korea
• Alexander V. Kir'yanov, Centro de Investigaciones en Optica, Mexico
• Yuri S. Kivshar, The Australian National University, Australia
• Jae-Hyeon Ko, Hallym University, Republic of Korea
• Dmitrii Kouznetsov, The University of Electro-Communication, Japan
• Juan Ignacio Larruquert, Consejo Superior de Investigaciones Científicas, Spain
• Chang-Hee Lee, Korea Advanced Institute of Science and Technology, Republic of Korea
• Byeong Ha Lee, Gwangju Institute of Science and Technology, Republic of Korea
• Yuxin Leng, Shanghai Institute of Optics and Fine Mechanics, China
• Baojun Li, Sun Yat-sen University, China
• Hongpu Li, Shizuoka University, Japan
• Ming J. Li, Corning Incorporated, China
• Jianfu Li, The Methodist Hospital Research Institue, USA
• Shien Kuei Liaw, National Taiwan University of Science and Technology, Taiwan
• Elefterios Lidorikis, University of Ioannina, Greece
• Hans Georg Limberger, Ecole Polytechnique Fédérale de Lausanne, Switzerland
• Fan-Yi Lin, National Tsing Hua University, Taiwan
• Natalia M. Litchinitser, State University of New York at Buffalo, USA
• Shutian Liu, Dalian University of Technology, China
• Jia-Ming Liu, University of California, Los Angeles, USA
• Ansheng Liu, Intel Corporation, USA
• Zhaoyan Liu, NASA Langley Research Center, USA
• Wen-Fung Liu, Feng Chia University, Taiwan
• Yan-ge Liu, Nankai University, China
• Manuel Lopez-Amo, Universidad Pública de Navarra, Spain
• Jose Miguel Lopez-Higuera, Universidad de Cantabria, Spain
• Hai-Han Lu, National Taipei University of Technology, Taiwan
• Baida Lu, Sichuan University, China
• Razzari Luca, Institut National de la Recherche Scientifique - Énergie, Matériaux et Télécommunications (INRS-EMT), Canada
• Liana Lucchetti, Università Politecnica delle Marche, Italy
• Guohong Ma, Shanghai University, China
• Glauco S. Maciel, Universidade Federal Fluminense, Brazil
• Arash Mafi, University of Wisconsin Milwaukee, USA
• Robert Magnusson, The University of Texas at Arlington, USA
• Hervé Maillotte, Institut FEMTO-ST, CNRS-Université de Franche-Comté, France
• Juliette Mangeney, Université Paris-Sud 11, France
• Alejandro Martinez, Universidad Politécnica de Valencia, Spain
• Vlastimil Matejec, Institute of Photonics and Electronics, Czech Republic
• Hirokazu Matsumoto, The University of Tokyo, Japan
• James McGinty, Imperial College London, United Kingdom
• Michele Midrio, University of Udine, Italy
• Stephen James Mihailov, Communications Research Center, Canada
• Juan J. Miret, University of Alicante, Spain
• Andrey Miroshnichenko, The Australian National University, Australia
• Kunal Mitra, Florida Institute of Technology, USA
• Germano Montemezzani, Université de Lorraine, France
• David Monzon-Hernandez, Centro de Investigaciones en Optica, Mexico
• Ignacio S. Moreno, Universidad Miguel Hernández de Elche, Spain
• Francesco Morichetti, Politencnico Di Milano, Italy
• Arnaud Mussot, Université Lille 1, France
• Izabela Naydenova, Dublin Institute of Technology, Ireland
• Natalia Noginova, Norfolk State University, USA
• Kyunghwan Oh, Yonsei University, Korea
• Min Cheol Oh, Pusan National University, Korea
• Yasuo Ohtera, Tohoku University, Japan
• Yuri B. Ovchinnikov, National Physical Laboratory, United Kingdom
• Dominique Pagnoux, Université de Limoges, France
• Krassimir Panajotov, Free University of Brussels, Belgium
• Lin Pang, University of California, San Diego, USA
• Chubing Peng, Seagate Technology, USA
• Gemma Piquero, Universidad Complutense, Spain
• Michael Pircher, Medical University of Vienna, Austria
• Nikos Pleros, Aristotle University of Thessaloniki, Greece
• Daniel Poitras, National Research Council Canada, Canada
• Luca Poletto, National Research Council of Italy, Italy
• Sergey Ponomarenko, Dalhousie University, Canada
• Mary Potasek, Simphotek, Inc., USA
• Wenxiu Que, Xi'an Jiaotong University, China
• Hector J. Rabal, Universidad Nacional de La Plata, Argentina
• Rama Raj, Centre National de la Research Scientifique, France
• Raul Rangel-Rojo, Centro de Investigación Científica y de Educación Superior de Ensenada, Mexico
• Narayana Rao, University of Hyderabad, India
• Vipul Rastogi, Indian Institute of Technology Roorkee, India
• Sergio R. Restaino, Naval Research Laboratory, USA
• Alan John Rogers, COST, United Kingdom
• Haisheng Rong, Intel Corporation, USA
• Zhichao Ruan, Royal Institute of Technology, Sweden
• Yinlan Ruan, The University of Adelaide, Australia
• Caesar A. Saloma, University of the Philippines Diliman, Philippines
• François Sanchez, Université d'Angers, France
• Jas S. Sanghera, United States Navy, USA
• Takashi Sato, Niigata University, Japan
• Lawrence Shah, University of Central Florida, USA
• Selim M. Shahriar, Northwestern University, USA
• Shouyuan Shi, University of Delaware, USA
• Jun Shibayama, Hosei University, Japan
• Jong-Dug Shin, Soongsil University, Republic of Korea
• Xuewen Shu, Aston University, United Kingdom
• Chester Shu, The Chinese University of Hong Kong, Hong Kong
• Venugopal Rao Soma, University of Hyderabad, India
• Kwang Yong Song, Chung-Ang University, Korea
• Andrey A. Sukhorukov, The Australian National University, Australia
• Ching Cherng Sun, National Central University, Taiwan
• Hidenori Taga, National Sun Yat-Sen University, Taiwan
• Hwayaw TAM, The Hong Kong Polytechnic University, Hong Kong
• Cho Jui Tay, National University of Singapore (NUS), Singapore
• Mark G. Thompson, Cambridge University, United Kingdom
• Vincent Toal, Dublin Institute of Technology, Ireland
• Mauro Tonelli, Università di Pisa, Italy
• Marcelo Trivi, Universidad Nacional de La Plata, Argentina
• Yasuhide Tsuji, Muroran Institute of Technology, Japan
• Juan A. Vallés, Universidad de Zaragoza, Spain
• Mikhail V. Vasnetsov, Institute of Physics, National Academy of Sciences of Ukraine (NASU), Ukraine
• Verónica Vázquez, Centro de Investigaciones en Optica, Mexico
• Gleb Vdovin, Flexible Optical BV, The Netherlands
• Gautam Vemuri, Indiana University-Purdue University Indianapolis, USA
• Georgios Veronis, Louisiana State University, USA
• Scott Wade, Swinburne University of Technology, Australia
• Dong-ning Wang, Hong Kong Polytechnic University, Hong Kong
• Xu Wang, Heriot Watt University, United Kingdom
• John A.R. Williams, Aston University, United Kingdom
• Deok Ha Woo, Korea Institute of Science and Technology, Korea
• Wenfa Xie, Jilin University, China
• Min Xu, Fairfield University, USA
• Gong Yandong, Institute for Infocomm Research, Singapore
• Changxi Yang, Tsinghua University, China
• Yoshiaki Yasuno, University of Tsukuba, Japan
• Siu Fung Yu, Hong Kong Polytechnic University, Hong Kong
• Robert J. Zawadzki, University of California Davis, USA
• Jaouad Zemmouri, OSYRIS, France
• Michalis Zervas, University of Southampton, United Kingdom
• Xingyu Zhang, Shandong University, China
• Chunmin Zhang, Xi'an Jiaotong University, China
• Linjie Zhou, Shanghai Jiao Tong University, China
• Maurizio Zoboli, Università di Modena e Reggio Emilia, Italy