Growth and Characterization of 𝐆𝐞_100−𝑥𝐃𝐲_𝑥(𝑥≤2) Nanowires

Figure 2

(a) A low-resolution TEM image of a Ge₉₈Dy₂ nanowire. (b) EDX spectrum acquired with an SEM, supplied with a Sahara II Silicon drift detector. In the inset is displayed the magnified part of the spectrum between 6 keV and 12 keV with DyL1, DyL2, DyL3, and GeK-peaks.

(a)

(b)