(a)
(b)
Figure 1:
In-plane
structure of the conducting layer in LaFeAs
O
1
−
𝑥
F
𝑥
(a) and L
a
1
−
𝑥
S
r
𝑥
Cu
O
4
(b). Use of polarization dependence (
E
//
ab
) XAS measurement can probe the planar local lattice projected onto the
𝑎
𝑏
-plane.