Experimental Progress towards Probing the Ground State of an Electron-Hole Bilayer by Low-Temperature Transport

Figure 11

(a) Electron and hole drag resistivities versus temperature for 𝑛=𝑝=9 and 11×10¹⁰  cm⁻² versus temperature, down to 50 mK. 𝑇² coefficients are 0.08 and 0.19Ω/□K⁻², respectively. (b) I-V trace for drag on electron layer for 𝑛=𝑝=9×10¹⁰ cm⁻², indicated by arrows (a). Electron and hole layer mobilities at 𝑇=1.5K, 𝜇_𝑒=1.5×10⁶ cm²V⁻¹s⁻¹ and 𝜇_ℎ=1.1×10⁵ cm²V⁻¹s⁻¹. (Device: B138/C4-1-10 nm Barrier).