Experimental Progress towards Probing the Ground State of an Electron-Hole Bilayer by Low-Temperature Transport
Figure 16
(a) Diagram showing that a sign reversal of the error in drag due to the excitation current leaking between layers is expected when biasing points (named C1, C2, D1, and D2) are altered, as the leakage current direction in the drag layer is changed. (b) Electron and hole drags for the two interlayer biasing configurations, for cm−2. (Device: B138/C4-2-10 nm Barrier).
