989732.fig.004a
(a)
989732.fig.004b
(b)
Figure 4: X-ray characterization of MBE-grown MgB2: (a) X-ray diffraction of a 200 nm film, showing only the MgB2(00l) diffraction peaks in addition to substrate peaks; (b) Reflectivity scan of a MgB2 thin film. The film thickness and roughness amplitude are extracted from the simulation fit to the data.