320612.fig.0014a
(a)
320612.fig.0014b
(b)
320612.fig.0014c
(c)
320612.fig.0014d
(d)
320612.fig.0014e
(e)
320612.fig.0014f
(f)
Figure 14: SEM micrographs. (a) Low magnification image of sintered trilayer sample, (b) interface microstructure, (c) low magnification image of sintered and annealed sample, (d) interface microstructure of sintered and annealed trilayer sample, (e) grain structure of PZT side and (f) grain structure of NZF side.