Research Article

Bipolar Resistive Switching Characteristic of Epitaxial NiO Thin Film on Nb-Doped S r T i O 3 Substrate

Figure 1

The XRD patterns for NiO/NSTO in θ-2θ scan (a) and Φ-scans of NiO (111) and NSTO (111) planes (b). Rocking curve scans of 200 peak for NiO (c). Typical XPS spectra of the NiO film for Ni 2p (d) and O1s (e).
364376.fig.001a
(a)
364376.fig.001b
(b)
364376.fig.001c
(c)
364376.fig.001d
(d)
364376.fig.001e
(e)