Research Article

The Effects of RF Sputtering Power and Gas Pressure on Structural and Electrical Properties of ITiO Thin Film

Figure 5

AFM morphologies of the ITiO film at different Ar gas pressures. (a) 5 mTorr, (b) 10 mTorr, (c) 15 mTorr, (d) 20 mTorr.
651587.fig.005a
(a)
651587.fig.005b
(b)
651587.fig.005c
(c)
651587.fig.005d
(d)