ZnO:Al Grown by Sputtering from Two Different Target Sources: A Comparison Study

<table>Grazing angle <i>θ</i>/2<i>θ</i> XRD scans taken at different angles for thin films grown from (a) ceramic targets. Film thickness is 1.0 <i>μ</i>m (b) powder targets. Film thickness is 1.0 <i>μ</i>m.</table>

Advances in Condensed Matter Physics

fig9

Figure 9

Figure 9: ZnO:Al Grown by Sputtering from Two Different Target Sources: A Comparison Study 