Review Article

Multiferroic Memories

Figure 4

Dependence of exchange bias (a) on domain size in 65 nm BFO thin films, (b) on thickness of CoFeB/BFO stacks deposited on STO (001), and (c) on domain size of CoFe/BFO heterostructure grown on mosaic-like and stripe-like BFO films. Figures were reproduced with permission from Martin et al. [48] and Béa et al. [50].
926290.fig.004a
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926290.fig.004b
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926290.fig.004c
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