Ellipsometric Characterization of Thin Films from Multicomponent Chalcogenide Glasses for Application in Modern Optical Devices
Figure 2
Relative changes in the thickness, , of thin films from the As-S (a), Ge-S (b), As-S-Se (c), and As-S-Ge (d) systems after exposure to white light as a function of Se and Ge content, respectively, (the lines connecting the experimental points are only drawn as a guide to the eye).
