Ellipsometric Characterization of Thin Films from Multicomponent Chalcogenide Glasses for Application in Modern Optical Devices

Figure 3

Theoretical Ψ-Δ dependence for thin As₄₀S_60−xSe_x films and the experimental data for thin (a) As₄₀S₆₀, (b) As₄₀S₃₀Se₃₀, and (c) As₄₀Se₆₀ films. The parameters of the theoretical curves are given in the graphs. The calculated film’s thickness is underlined (the dotted lines connecting the experimental points are only drawn as a guide to the eye).

(a)

(b)

(c)