Ellipsometric Characterization of Thin Films from Multicomponent Chalcogenide Glasses for Application in Modern Optical Devices
Figure 4
Comparison of theoretical (dotted and solid lines for single and double layer models, resp.) and experimental values (symbols) of and for thin As38S56Bi6 film depending on the angle of light incidence (a) and schematic representation of the two-layer model with calculated values for optical parameters (b).
