Ellipsometric Characterization of Thin Films from Multicomponent Chalcogenide Glasses for Application in Modern Optical Devices

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</svg>) from bulk As<sub>38</sub>S<sub>56</sub>Bi<sub>6</sub> glass.</table>

Advances in Condensed Matter Physics

fig6

Figure 6

Figure 6: Ellipsometric Characterization of Thin Films from Multicomponent Chalcogenide Glasses for Application in Modern Optical Devices 