Ellipsometric Characterization of Thin Films from Multicomponent Chalcogenide Glasses for Application in Modern Optical Devices

Table 2

Optical constants (refractive index, 𝑛, extinction coefficient, 𝑘) at 𝜆=632.8 nm and thickness, 𝑑 of thin chalcogenide films before and after light exposure.

Composition of thin film	n unexp	n exp	k unexp	k exp	d unexp [nm]	d exp [nm]
As40S60	2.458	2.531	0.001	0.003	1032	996
As10Ge30S60	2.320	2.226	0	0.001	1208	1279
As20Ge20S60	2.393	2.300	0	0	1172	1202
As30Ge10S60	2.438	2.415	0.003	0.003	1128	1136
Ge20S80	2.138	2.079	0	0	741	775
Ge33S67	2.172	2.056	0.005	0	970	990
Ge40S60	2.577	2.524	0.001	0	1187	1218
As28Se72	2.979	3.047	0.039	0.037	893	929
As40Se60	3.031	3.155	0.036	0.054	822	801
As50Se50	2.874	3.101	0.014	0.041	803	795
As40S45Se15	2.567	2.687	<0.001	<0.001	1045	1035
As40S30Se30	2.763	2.820	0.007	0.013	997	985
As40S15Se45	2.845	2.991	0.013	0.043	879	865