Relativistic Ultrafast Electron Microscopy: Single-Shot Diffraction Imaging with Femtosecond Electron Pulses

Figure 3

Intensity profiles along the (-420) and (4-20) spots of the images acquired by single-shot (broken curve) and 100-pulse integration (solid curve). The rms width of the (000) spot was obtained as 0.018 ± 0.001 Å⁻¹ from the intensity profile of the single-shot image with a Gaussian fit.