Research Article

Effect of Oxygen Mixing Percentage on Mechanical and Microwave Dielectric Properties of SrBi4Ti4O15 Thin Films

Table 1

Atomic percentage of each element of SrBi4Ti4O15 thin films obtained from EDX analysis.

ElementStandard values (%)Atomic % of SrBi4Ti4O15 thin films

Ti K16.6616.34
Sr L4.164.13
Bi M16.6616.46
O62.4962.31