Research Article

Proton Irradiations on SJ HV Power MOSFETs to Realize Fast Diode Devices

Table 5

Main results on wafer bench—implantation on the back EPI layer.

Dose [cm−2]SJ HV power MOSFETs results
[A] [ns] [nC]BVdss [V]

5 * 10129.52321108630
1 * 101211.92821678660
5 * 101113.53352262670
1 * 101119.14774550680
No irradiation29.65347582680
Std. electrons8.7184877660