Effect of the Substrate Movement on the Optical Properties of ZnO Thin Films Deposited by Ultrasonic Spray Pyrolysis

<table>Diffraction angle shift of (002) peak for the ZnO thin films. Peak intensities are normalized with respect to that of ZnO film on the linear moved substrate (Label L, F, and R show the deposited films on the linear moved substrate, on the fixed substrate, and on the rotated substrate, resp.). Dashed line indicates reference value (34.42°).</table>

Advances in Materials Science and Engineering

fig5

Figure 5

Figure 5: Effect of the Substrate Movement on the Optical Properties of ZnO Thin Films Deposited by Ultrasonic Spray Pyrolysis 