Morphological, Structural, and Optical Properties of Single-Phase Cu(In,Ga)Se<sub>2</sub> Thin Films from the Selenization of Thermally Evaporated InSe/Cu/GaSe Precursors

<table>(a) XRD patterns of the precursor and CuIn<sub>1−<i>x</i></sub>Ga<sub><i>x</i></sub>Se<sub>2</sub> selenized thin films with different gallium incorporations (<i>x</i> = 0.02, 0.22, and 0.35). (b) Position of the [116/312] diffraction peaks of single-phase CuIn<sub>1−<i>x</i></sub>Ga<sub><i>x</i></sub>Se<sub>2</sub> as function of gallium concentration (<i>x</i> = 0.02, 0.22, and 0.35).</table>

Advances in Materials Science and Engineering

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Figure 2: Morphological, Structural, and Optical Properties of Single-Phase Cu(In,Ga)Se<sub>2</sub> Thin Films from the Selenization of Thermally Evaporated InSe/Cu/GaSe Precursors 

Figure 2 | Morphological, Structural, and Optical Properties of Single-Phase Cu(In,Ga)Se2 Thin Films from the Selenization of Thermally Evaporated InSe/Cu/GaSe Precursors 